Inventor · disambiguated record
Shekhar Bapat
Also filed as: BAPAT SHEKHAR · CHAUDHARY KAMAL
18 granted patents·736 citations·filing 1996–2008
96Inventor score
Files withXILINX INC18
Top patents by PatentIndex Score
18 records- 0197US5963050AConfigurable logic element with fast feedback pathsXILINX INC·Filed 1997·Granted Oct 5, 1999·129 cites·13 claims
- 0296US5936424AHigh speed bus with tree structure for selecting bus driverXILINX INC·Filed 1997·Granted Aug 10, 1999·128 cites·13 claims
- 0396US5920202AConfigurable logic element with ability to evaluate five and six input functionsXILINX INC·Filed 1997·Granted Jul 6, 1999·121 cites·11 claims
- 0493US6107827AFPGA CLE with two independent carry chainsXILINX INC·Filed 1999·Granted Aug 22, 2000·59 cites·8 claims
- 0591US6124731AConfigurable logic element with ability to evaluate wide logic functionsXILINX INC·Filed 2000·Granted Sep 26, 2000·37 cites·6 claims
- 0688US6051992AConfigurable logic element with ability to evaluate five and six input functionsXILINX INC·Filed 1999·Granted Apr 18, 2000·44 cites·4 claims
- 0787US6429715B1Deskewing clock signals for off-chip devicesXILINX INC·Filed 2000·Granted Aug 6, 2002·53 cites·10 claims
- 0881US6362648B1Multiplexer for implementing logic functions in a programmable logic deviceXILINX INC·Filed 2000·Granted Mar 26, 2002·19 cites·35 claims
- 0980US7007250B1Application-specific methods useful for testing look up tables in programmable logic devicesXILINX INC·Filed 2003·Granted Feb 28, 2006·20 cites·19 claims
- 1079US7310758B1Circuit for and method of implementing programmable logic devicesXILINX INC·Filed 2005·Granted Dec 18, 2007·12 cites·16 claims
- 1178US7315972B1Method and apparatus for automated generation of expected value data for circuit designsXILINX INC·Filed 2004·Granted Jan 1, 2008·20 cites·21 claims
- 1277US5847580AHigh speed bidirectional bus with multiplexersXILINX INC·Filed 1996·Granted Dec 8, 1998·32 cites·20 claims
- 1371US7725787B1Testing of a programmable deviceXILINX INC·Filed 2008·Granted May 25, 2010·5 cites·20 claims
- 1470US7219314B1Application-specific methods for testing molectronic or nanoscale devicesXILINX INC·Filed 2004·Granted May 15, 2007·14 cites·17 claims
- 1570US6201410B1Wide logic gate implemented in an FPGA configurable logic elementXILINX INC·Filed 1999·Granted Mar 13, 2001·20 cites·33 claims
- 1665US7469371B1Methods of testing a user design in a programmable integrated circuitXILINX INC·Filed 2006·Granted Dec 23, 2008·4 cites·12 claims
- 1760US5844424AProgrammably bidirectional buffered interconnect circuitXILINX INC·Filed 1997·Granted Dec 1, 1998·16 cites·2 claims
- 1847US7454675B1Testing of a programmable deviceXILINX INC·Filed 2004·Granted Nov 18, 2008·3 cites·16 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →