Inventor · disambiguated record
Sheng-Hsiang Chuang
Also filed as: CHUANG SHENG-HSIANG
20 granted patents·33 citations·filing 2014–2024
92Inventor score
Files withTAIWAN SEMICONDUCTOR MFG CO LTD20
Top patents by PatentIndex Score
20 records- 0193US11961770B2Automated inspection toolTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Apr 16, 2024·3 cites·20 claims
- 0293US10569520B2Wafer debonding system and methodTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted Feb 25, 2020·7 cites·20 claims
- 0390US10490463B2Automated inspection toolTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted Nov 26, 2019·7 cites·20 claims
- 0490US10155369B2Wafer debonding system and methodTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2017·Granted Dec 18, 2018·5 cites·7 claims
- 0588US10889097B2Wafer debonding system and methodTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Jan 12, 2021·3 cites·20 claims
- 0685US11430108B2Defect offset correctionTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Aug 30, 2022·1 cites·20 claims
- 0784US12334373B2Apparatus and method for inspecting wafer carriersTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Granted Jun 17, 2025·0 cites·20 claims
- 0883US10714364B2Apparatus and method for inspecting wafer carriersTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted Jul 14, 2020·2 cites·20 claims
- 0982US10852704B2Semiconductor equipment management method, electronic device, and non-transitory computer readable storage mediumTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted Dec 1, 2020·2 cites·20 claims
- 1078US11842481B2Defect offset correctionTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Dec 12, 2023·0 cites·20 claims
- 1173US11171065B2Automated inspection toolTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Nov 9, 2021·1 cites·20 claims
- 1271US11929271B2Apparatus and method for inspecting wafer carriersTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Mar 12, 2024·0 cites·20 claims
- 1370US10872794B2Automatic in-line inspection systemTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted Dec 22, 2020·1 cites·20 claims
- 1469US10876976B2Apparatus and method for substrate inspectionTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted Dec 29, 2020·1 cites·20 claims
- 1568US11754989B2Semiconductor equipment management method, electronic device, and non-transitory computer readable storage mediumTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Sep 12, 2023·0 cites·20 claims
- 1660US10839507B2Defect offset correctionTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted Nov 17, 2020·0 cites·20 claims
- 1754US11651981B2Method and system for map-free inspection of semiconductor devicesTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted May 16, 2023·0 cites·20 claims
- 1851US10018573B2Dual-function wafer handling apparatusTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2014·Granted Jul 10, 2018·0 cites·20 claims
- 1950US11120539B2Topological scanning method and systemTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted Sep 14, 2021·0 cites·20 claims
- 2048US11152238B2Semiconductor processing stage profiler jigTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted Oct 19, 2021·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →