Inventor · disambiguated record
Shaul Cohen
Also filed as: COHEN SHAUL
10 granted patents·1 pending application·15 citations·filing 2014–2022
79Inventor score
Top patents by PatentIndex Score
11 records- 0194US11022566B1Examination of a semiconductor specimenAPPLIED MATERIALS ISRAEL LTD·Filed 2020·Granted Jun 1, 2021·13 cites·29 claims
- 0280US11232550B2Generating a training set usable for examination of a semiconductor specimenAPPLIED MATERIALS ISRAEL LTD·Filed 2020·Granted Jan 25, 2022·2 cites·20 claims
- 0357US10571406B2Method of performing metrology operations and system thereofAPPLIED MATERIALS ISRAEL LTD·Filed 2018·Granted Feb 25, 2020·0 cites·20 claims
- 0456US10120973B2Method of performing metrology operations and system thereofAPPLIED MATERIALS ISRAEL LTD·Filed 2017·Granted Nov 6, 2018·0 cites·17 claims
- 0551US12260543B2Machine learning based examination of a semiconductor specimen and training thereofAPPLIED MATERIALS ISRAEL LTD·Filed 2022·Granted Mar 25, 2025·0 cites·20 claims
- 0648US11631179B2Segmentation of an image of a semiconductor specimenAPPLIED MATERIALS ISRAEL LTD·Filed 2020·Granted Apr 18, 2023·0 cites·20 claims
- 0746US10504693B2Evaluating an objectAPPLIED MATERIALS ISRAEL LTD·Filed 2018·Granted Dec 10, 2019·0 cites·15 claims
- 0845US11854184B2Determination of defects and/or edge roughness in a specimen based on a reference imageAPPLIED MATERIALS ISRAEL LTD·Filed 2021·Granted Dec 26, 2023·0 cites·16 claims
- 0943US10902620B1Registration between an image of an object and a descriptionAPPLIED MATERIALS ISRAEL LTD·Filed 2019·Granted Jan 26, 2021·0 cites·19 claims
- 1041US10296702B2Method of performing metrology operations and system thereofAPPLIED MATERIALS ISRAEL LTD·Filed 2017·Granted May 21, 2019·0 cites·20 claims
- 1141US2015119742A1Nasal oxygen mask and breathing circuit assemblyUNIV RUTGERS·Filed 2014·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Shaul Cohen files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →