Inventor · disambiguated record
Shyh-Shin Ferng
Also filed as: FERNG SHYH-SHIN
5 granted patents·1 pending application·43 citations·filing 2016–2022
74Inventor score
Files withTAIWAN SEMICONDUCTOR MFG CO LTD4IND TECH RES INST1SEMILAB SEMICONDUCTOR PHYSICS LABORATORY CO LTD1
Top patents by PatentIndex Score
6 records- 0196US10151713B2X-ray reflectometry apparatus for samples with a miniscule measurement area and a thickness in nanometers and method thereofIND TECH RES INST·Filed 2016·Granted Dec 11, 2018·38 cites·18 claims
- 0282US11071513B2Test key design to enable X-ray scatterometry measurementTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Jul 27, 2021·3 cites·20 claims
- 0375US10499876B2Test key design to enable X-ray scatterometry measurementTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2017·Granted Dec 10, 2019·2 cites·20 claims
- 0462US2022359766A1Semiconductor Device and Method of ManufacturingTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Application pending·0 cites
- 0560US11658245B2Semiconductor device and method of manufacturingTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted May 23, 2023·0 cites·20 claims
- 0643US10763179B2Non-contact method to monitor and quantify effective work function of metalsSEMILAB SEMICONDUCTOR PHYSICS LABORATORY CO LTD·Filed 2016·Granted Sep 1, 2020·0 cites·15 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →