Inventor · disambiguated record
Shingo Hayashi
Also filed as: HAYASHI SHINGO
24 granted patents·13 pending applications·35 citations·filing 2009–2025
92Inventor score
Files withFUJI ELECTRIC CO LTD8OMRON TATEISI ELECTRONICS CO6HITACHI LTD5TORAY INDUSTRIES4HITACHI HIGH TECH CORP3
Top patents by PatentIndex Score
37 records- 0191US10078236B2Dimmer and video display device using the sameHITACHI LG DATA STORAGE INC·Filed 2016·Granted Sep 18, 2018·5 cites·2 claims
- 0288US8820734B2Loading device for recording media, control method thereof, and recording mediumMIYAKAWA TAKAHIRO·Filed 2013·Granted Sep 2, 2014·9 cites·8 claims
- 0387US9840760B2Powder made of iron-base metallic glassSINTOKOGIO LTD·Filed 2013·Granted Dec 12, 2017·5 cites·8 claims
- 0483US11936985B2Appearance inspection device and defect inspection methodOMRON TATEISI ELECTRONICS CO·Filed 2020·Granted Mar 19, 2024·2 cites·11 claims
- 0583US10365490B2Head-mounted display, head-up display and picture displaying methodMAXELL LTD·Filed 2015·Granted Jul 30, 2019·4 cites·14 claims
- 0680US8345077B2Write device, image forming apparatus, and open/close control methodRICOH CO LTD·Filed 2010·Granted Jan 1, 2013·3 cites·20 claims
- 0768US10805552B2Visual inspection device and illumination condition setting method of visual inspection deviceOMRON TATEISI ELECTRONICS CO·Filed 2018·Granted Oct 13, 2020·1 cites·19 claims
- 0864US8432583B2Image forming apparatusHAYASHI SHINGO·Filed 2009·Granted Apr 30, 2013·2 cites·16 claims
- 0963US10512861B2Electret fiber sheetTORAY INDUSTRIES·Filed 2016·Granted Dec 24, 2019·0 cites·2 claims
- 1062US8508803B2Image reading apparatus and image reading method including a dividing unit that divides image data into vertical-streak-correction subject dataHAYASHI SHINGO·Filed 2009·Granted Aug 13, 2013·4 cites·16 claims
- 1162US2025140629A1Semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2024·Application pending·0 cites
- 1260US2024404906A1Semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2024·Application pending·0 cites
- 1360US2025179705A1Method and apparatus for manufacturing electret melt blown nonwoven fabricTORAY INDUSTRIES·Filed 2023·Application pending·0 cites
- 1459US12379325B2External appearance inspection apparatus and external appearance inspection methodOMRON TATEISI ELECTRONICS CO·Filed 2020·Granted Aug 5, 2025·0 cites·6 claims
- 1559US12340970B2Charged particle beam device, and method for controlling charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2020·Granted Jun 24, 2025·0 cites·14 claims
- 1658US12507452B2Silicon carbide semiconductor device and method of manufacturing silicon carbide semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2023·Granted Dec 23, 2025·0 cites·14 claims
- 1758US2023342697A1Work supporting apparatus and work supporting systemHITACHI LTD·Filed 2023·Application pending·0 cites
- 1856US2025305104A1Iron-based amorphous alloy, powdery/granular material thereof, and compacted powder material thereofSINTOKOGIO LTD·Filed 2025·Application pending·0 cites
- 1953US12326835B2File management system and work support systemHITACHI LTD·Filed 2024·Granted Jun 10, 2025·0 cites·15 claims
- 2052US2023223470A1Silicon carbide semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2022·Application pending·0 cites
- 2151US12072180B2Measurement method for amount of deviation, and measurement apparatusOMRON TATEISI ELECTRONICS CO·Filed 2023·Granted Aug 27, 2024·0 cites·12 claims
- 2251US2024274395A1Charged particle beam device and method for demagnetizing magnetic lensHITACHI HIGH TECH CORP·Filed 2021·Application pending·0 cites
- 2350US12349451B2Silicon carbide semiconductor device and method of manufacturing silicon carbide semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2021·Granted Jul 1, 2025·0 cites·3 claims
- 2450US12132083B2Silicon carbide semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2022·Granted Oct 29, 2024·0 cites·7 claims
- 2550US2024193330A1Work support apparatus and work support methodHITACHI LTD·Filed 2023·Application pending·0 cites
- 2648US11709050B2Position measurement method using a calibration plate to correct a detection value from the position detectorOMRON TATEISI ELECTRONICS CO·Filed 2020·Granted Jul 25, 2023·0 cites·5 claims
- 2747US12327708B2Charged particle beam device and aberration correction methodHITACHI HIGH TECH CORP·Filed 2019·Granted Jun 10, 2025·0 cites·8 claims
- 2847US11742392B2Silicon carbide semiconductor device and method of manufacturing silicon carbide semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2021·Granted Aug 29, 2023·0 cites·8 claims
- 2947US2023233966A1Electret fiber sheet, laminate sheet, and filterTORAY INDUSTRIES·Filed 2021·Application pending·0 cites
- 3047US2024265720A1Work assistance system and work assistance methodHITACHI LTD·Filed 2023·Application pending·0 cites
- 3145US2020370217A1Nonwoven fabric and air filter material including the sameTORAY INDUSTRIES·Filed 2019·Application pending·0 cites
- 3245US2023237232A1Work support device, work support system, and analysis programHITACHI LTD·Filed 2023·Application pending·0 cites
- 3344US12372897B2Image forming apparatus, image forming method, and printed materialTAJIMA SAKI·Filed 2023·Granted Jul 29, 2025·0 cites·7 claims
- 3444US11333535B2Method for correcting values detected by linear scalesOMRON TATEISI ELECTRONICS CO·Filed 2019·Granted May 17, 2022·0 cites·4 claims
- 3542US11721756B2Semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2021·Granted Aug 8, 2023·0 cites·7 claims
- 3642US11035064B2Washing and drying machineQINGDAO HAIER WASHING MACH CO·Filed 2016·Granted Jun 15, 2021·0 cites·17 claims
- 3741US2019119797A1Iron-based metallic glass alloy powderSINTOKOGIO LTD·Filed 2017·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →