Inventor · disambiguated record
Shigeaki Hijikata
Also filed as: HIJIKATA SHIGEAKI
5 granted patents·1 pending application·75 citations·filing 2000–2009
81Inventor score
Top patents by PatentIndex Score
6 records- 0191US6583414B2Method of inspecting pattern and inspecting instrumentHITACHI LTD·Filed 2000·Granted Jun 24, 2003·52 cites·17 claims
- 0285US8558173B2Method of inspecting pattern and inspecting instrumentNOZOE MARI·Filed 2006·Granted Oct 15, 2013·7 cites·6 claims
- 0374US6777677B2Method of inspecting pattern and inspecting instrumentHITACHI LTD·Filed 2003·Granted Aug 17, 2004·8 cites·7 claims
- 0472US7112791B2Method of inspecting pattern and inspecting instrumentHITACHI LTD·Filed 2004·Granted Sep 26, 2006·6 cites·7 claims
- 0565US8358406B2Defect inspection method and defect inspection systemHITACHI HIGH TECH CORP·Filed 2009·Granted Jan 22, 2013·2 cites·10 claims
- 0648US2008298669A1Data processing apparatus and data processing methodHITACHI HIGH TECH CORP·Filed 2008·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →