Inventor · disambiguated record
Shigeyuki Hosoki
Also filed as: HOSOKI SHIGEYUKI · KAWABE USHIO
29 granted patents·898 citations·filing 1976–2003
98Inventor score
Files withHITACHI LTD29
Top patents by PatentIndex Score
29 records- 0198US6875984B2Bio electron microscope and observation method of specimenHITACHI LTD·Filed 2003·Granted Apr 5, 2005·105 cites·14 claims
- 0297US5436448ASurface observing apparatus and methodHITACHI LTD·Filed 1993·Granted Jul 25, 1995·134 cites·24 claims
- 0396US4143292AField emission cathode of glassy carbon and method of preparationHITACHI LTD·Filed 1976·Granted Mar 6, 1979·51 cites·30 claims
- 0492US5416331ASurface atom fabrication method and apparatusHITACHI LTD·Filed 1992·Granted May 16, 1995·69 cites·36 claims
- 0590US4379250AField emission cathode and method of fabricating the sameHITACHI LTD·Filed 1980·Granted Apr 5, 1983·39 cites·18 claims
- 0683US4193013ACathode for an electron source and a method of producing the sameHITACHI LTD·Filed 1978·Granted Mar 11, 1980·19 cites·14 claims
- 0782US4883959AScanning surface microscope using a micro-balance device for holding a probe-tipHITACHI LTD·Filed 1988·Granted Nov 28, 1989·41 cites·6 claims
- 0881US4841191APiezoelectric actuator control apparatusHITACHI LTD·Filed 1988·Granted Jun 20, 1989·46 cites·9 claims
- 0980US4912351APiezoelectric motorHITACHI LTD·Filed 1988·Granted Mar 27, 1990·38 cites·16 claims
- 1079US5140272AMethod of semiconductor surface measurment and an apparatus for realizing the sameHITACHI LTD·Filed 1988·Granted Aug 18, 1992·34 cites·8 claims
- 1178US5431055ASurface measuring apparatus using a probe microscopeHITACHI LTD·Filed 1993·Granted Jul 11, 1995·33 cites·20 claims
- 1277US5229607ACombination apparatus having a scanning electron microscope thereinHITACHI LTD·Filed 1991·Granted Jul 20, 1993·47 cites·29 claims
- 1374US5689494ASurface atom fabrication method and apparatusHITACHI LTD·Filed 1995·Granted Nov 18, 1997·22 cites·20 claims
- 1474US5585722AApparatus for measuring physical properties of micro areaHITACHI LTD·Filed 1994·Granted Dec 17, 1996·36 cites·8 claims
- 1568US5767516AElectron microscope and sample observing method using the sameHITACHI LTD·Filed 1996·Granted Jun 16, 1998·20 cites·9 claims
- 1668US5144128ASurface microscope and surface microscopyHITACHI LTD·Filed 1991·Granted Sep 1, 1992·29 cites·5 claims
- 1767US5162653AScanning tunneling microscope and surface topographic observation methodHITACHI LTD·Filed 1991·Granted Nov 10, 1992·28 cites·30 claims
- 1867US4438371ASource of charged particles beamHITACHI LTD·Filed 1982·Granted Mar 20, 1984·12 cites·12 claims
- 1961US5001409ASurface metrological apparatusHITACHI LTD·Filed 1988·Granted Mar 19, 1991·12 cites·19 claims
- 2055US4772817ACathode mounting a high-frequency piezoelectric chipHITACHI LTD·Filed 1987·Granted Sep 20, 1988·8 cites·4 claims
- 2151US5036196ASurface microscopeHITACHI LTD·Filed 1990·Granted Jul 30, 1991·14 cites·23 claims
- 2250US5746826AMethod and apparatus for forming microstructure bodyHITACHI LTD·Filed 1994·Granted May 5, 1998·20 cites·40 claims
- 2349US5222396ATunnelling acoustic microscopeHITACHI LTD·Filed 1992·Granted Jun 29, 1993·10 cites·18 claims
- 2449US4786922AElectron beam recording and reproducing apparatusHITACHI LTD·Filed 1987·Granted Nov 22, 1988·7 cites·8 claims
- 2547US5256876AScanning tunnel microscope equipped with scanning electron microscopeHITACHI LTD·Filed 1991·Granted Oct 26, 1993·12 cites·7 claims
- 2639US5393983AMagnetic electron lens and elctron microscope using the sameHITACHI LTD·Filed 1992·Granted Feb 28, 1995·4 cites·13 claims
- 2734US4772821AApparatus for introducing oxygen gasHITACHI LTD·Filed 1986·Granted Sep 20, 1988·2 cites·4 claims
- 2833US5698798AMethod and apparatus for dynamic observation of specimenHITACHI LTD·Filed 1995·Granted Dec 16, 1997·3 cites·8 claims
- 2932US5572122AApparatus including a specimen tilt mechanism for measuring electromagnetic field distribution in the specimen using a focused electron beamHITACHI LTD·Filed 1993·Granted Nov 5, 1996·3 cites·8 claims
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