Inventor · disambiguated record
Shih-Cheng Hsueh
Also filed as: HSUEH SHIH-CHENG
11 granted patents·263 citations·filing 2000–2003
92Inventor score
Files withXILINX INC11
Top patents by PatentIndex Score
11 records- 0191US7032194B1Layout correction algorithms for removing stress and other physical effect induced process deviationXILINX INC·Filed 2003·Granted Apr 18, 2006·87 cites·28 claims
- 0286US6393714B1Resistor arrays for mask-alignment detectionXILINX INC·Filed 2000·Granted May 28, 2002·39 cites·20 claims
- 0383US6569576B1Reticle cover for preventing ESD damageXILINX INC·Filed 2000·Granted May 27, 2003·22 cites·13 claims
- 0483US6426534B1Methods and circuits employing threshold voltages for mask-alignment detectionXILINX INC·Filed 2000·Granted Jul 30, 2002·25 cites·14 claims
- 0582US6305095B1Methods and circuits for mask-alignment detectionXILINX INC·Filed 2000·Granted Oct 23, 2001·25 cites·20 claims
- 0680US6563320B1Mask alignment structure for IC layersXILINX INC·Filed 2000·Granted May 13, 2003·21 cites·40 claims
- 0775US6716653B2Mask alignment structure for IC layersXILINX INC·Filed 2002·Granted Apr 6, 2004·16 cites·14 claims
- 0870US6436726B2Methods and circuits for mask-alignment detectionXILINX INC·Filed 2001·Granted Aug 20, 2002·11 cites·9 claims
- 0965US6465305B1Methods and circuits employing threshold voltages for mask-alignment detectionXILINX INC·Filed 2002·Granted Oct 15, 2002·8 cites·12 claims
- 1058US6878561B2Mask-alignment detection circuit in X and Y directionsXILINX INC·Filed 2003·Granted Apr 12, 2005·5 cites·7 claims
- 1155US6684520B1Mask-alignment detection circuit in x and y directionsXILINX INC·Filed 2000·Granted Feb 3, 2004·4 cites·14 claims
Join the waitlist — get patent alerts
Get an alert when Shih-Cheng Hsueh files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →