Inventor · disambiguated record
Shuiqing Hu
Also filed as: HU SHUIQING
24 granted patents·7 pending applications·137 citations·filing 2009–2025
95Inventor score
Top patents by PatentIndex Score
31 records- 0197US9588136B2Method and apparatus of operating a scanning probe microscopeBRUKER NANO INC·Filed 2016·Granted Mar 7, 2017·8 cites·15 claims
- 0296US8739309B2Method and apparatus of operating a scanning probe microscopeHU YAN·Filed 2009·Granted May 27, 2014·19 cites·27 claims
- 0396US8650660B2Method and apparatus of using peak force tapping mode to measure physical properties of a sampleSHI JIAN·Filed 2011·Granted Feb 11, 2014·34 cites·8 claims
- 0495US9322842B2Method and apparatus of operating a scanning probe microscopeBRUKER NANO INC·Filed 2014·Granted Apr 26, 2016·10 cites·19 claims
- 0592US9291640B2Method and apparatus of using peak force tapping mode to measure physical properties of a sampleBRUKER NANO INC·Filed 2014·Granted Mar 22, 2016·9 cites·10 claims
- 0691US9910064B2Force measurement with real-time baseline determinationBRUKER NANO INC·Filed 2017·Granted Mar 6, 2018·3 cites·11 claims
- 0791US9213047B2Method and apparatus of electrical property measurement using an AFM operating in peak force tapping modeBRUKER NANO INC·Filed 2013·Granted Dec 15, 2015·7 cites·17 claims
- 0891US8646109B2Method and apparatus of operating a scanning probe microscopeHU YAN·Filed 2010·Granted Feb 4, 2014·27 cites·21 claims
- 0986US10502761B2Method and apparatus of operating a scanning probe microscopeBRUKER NANO INC·Filed 2017·Granted Dec 10, 2019·1 cites·7 claims
- 1086US10197596B2Method and apparatus of operating a scanning probe microscopeBRUKER NANO INC·Filed 2017·Granted Feb 5, 2019·1 cites·12 claims
- 1186US9575090B2Force measurement with real-time baseline determinationBRUKER NANO INC·Filed 2014·Granted Feb 21, 2017·5 cites·9 claims
- 1286US8997259B2Method and apparatus of tuning a scanning probe microscopeBRUKER NANO INC·Filed 2012·Granted Mar 31, 2015·5 cites·20 claims
- 1383US9810713B2Method and apparatus of operating a scanning probe microscopeBRUKER NANO INC·Filed 2016·Granted Nov 7, 2017·1 cites·16 claims
- 1481US9869694B2Method and apparatus of electrical property measurement using an AFM operating in peak force tapping modeBRUKER NANO INC·Filed 2015·Granted Jan 16, 2018·1 cites·16 claims
- 1579US11002757B2Method and apparatus of operating a scanning probe microscopeBRUKER NANO INC·Filed 2019·Granted May 11, 2021·0 cites·14 claims
- 1679US9995765B2Method and apparatus of using peak force tapping mode to measure physical properties of a sampleBRUKER NANO INC·Filed 2016·Granted Jun 12, 2018·1 cites·9 claims
- 1777US10175263B2Sample vessel retention structure for scanning probe microscopeBRUKER NANO INC·Filed 2016·Granted Jan 8, 2019·1 cites·23 claims
- 1871US9739799B2Method and apparatus to compensate for deflection artifacts in an atomic force microscopeBRUKER NANO INC·Filed 2014·Granted Aug 22, 2017·2 cites·17 claims
- 1970US11555827B2Torsion wing probe assemblyBRUKER NANO INC·Filed 2021·Granted Jan 17, 2023·0 cites·10 claims
- 2068US10663483B2Method and apparatus of using peak force tapping mode to measure physical properties of a sampleBRUKER NANO INC·Filed 2018·Granted May 26, 2020·0 cites·3 claims
- 2168US9274139B2Method and apparatus of operating a scanning probe microscopeBRUKER NANO INC·Filed 2014·Granted Mar 1, 2016·2 cites·20 claims
- 2266US11119118B2Torsion wing probe assemblyBRUKER NANO INC·Filed 2020·Granted Sep 14, 2021·0 cites·18 claims
- 2360US2025277809A1Probe-Based Instrument and Method Using Torsional Oscillation SensingBRUKER NANO INC·Filed 2025·Application pending·0 cites
- 2459US9116167B2Method and apparatus of tuning a scanning probe microscopeBRUKER NANO INC·Filed 2015·Granted Aug 25, 2015·0 cites·11 claims
- 2558US2019212361A1Sample vessel retention structure for scanning probe microscopeBRUKER NANO INC·Filed 2019·Application pending·0 cites
- 2658US2025290948A1Atomic Force Microscope Based Infrared Spectroscopy With Multiple Laser Pulse Repetition Rate Excitation And Optional Force Volume OperationBRUKER NANO INC·Filed 2025·Application pending·0 cites
- 2757US2024168053A1Nano-Mechanical Infrared Spectroscopy System and Method Using Gated Peak Force IRBRUKER NANO INC·Filed 2023·Application pending·0 cites
- 2856US2016109477A1Method and Apparatus of Tuning a Scanning Probe MicroscopeBRUKER NANO INC·Filed 2015·Application pending·0 cites
- 2955US2025244359A1Method and Apparatus of Magnetic Property Measurement Using an AFM Operating in a Force Mapping AFM ModeBRUKER NANO INC·Filed 2025·Application pending·0 cites
- 3048US2021396784A1Device, and Method of Manufacture, for use in Mechanically Cleaning Nanoscale Debris from a Sample SurfaceBRUKER NANO INC·Filed 2021·Application pending·0 cites
- 3139US12345147B2Multi-stage temporary plugging fracturing method based on stress cage effect, device thereof and storage mediumBEIJING INST PETROCHEM TECH·Filed 2024·Granted Jul 1, 2025·0 cites·8 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →