Inventor · disambiguated record
Shigeaki Ide
Also filed as: IDE SHIGEAKI
9 granted patents·3 pending applications·570 citations·filing 1989–2009
90Inventor score
Top patents by PatentIndex Score
12 records- 0196US6241822B1Vertical heat treatment apparatusNEC CORP·Filed 2000·Granted Jun 5, 2001·428 cites·12 claims
- 0287US5603772AFurnace equipped with independently controllable heater elements for uniformly heating semiconductor wafersNEC CORP·Filed 1995·Granted Feb 18, 1997·65 cites·7 claims
- 0363US6506256B2Method and apparatus for diffusion of an impurity into a semiconductor wafer with high in-plane diffusion uniformityNEC CORP·Filed 2001·Granted Jan 14, 2003·8 cites·3 claims
- 0455US6316748B1Apparatus for manufacturing a semiconductor deviceNEC CORP·Filed 2000·Granted Nov 13, 2001·5 cites·8 claims
- 0554US6638141B2Method and apparatus for chemical-mechanical polishingNEC ELECTRONICS CORP·Filed 2002·Granted Oct 28, 2003·6 cites·12 claims
- 0651US6004304ASubcutaneous needle and method of producing the sameSEIRIN KASEI CO LTD·Filed 1998·Granted Dec 21, 1999·24 cites·4 claims
- 0751US5013692AProcess for preparing a silicon nitride insulating film for semiconductor memory deviceSHARP KK·Filed 1989·Granted May 7, 1991·22 cites·10 claims
- 0850US2008255599A1Acupuncture needleTOYO RESIN CORP·Filed 2008·Application pending·0 cites
- 0948US6536455B1Diffusion reactor with sloped bottom plate suitable for cleaning the sameNEC CORP·Filed 2000·Granted Mar 25, 2003·2 cites·10 claims
- 1047US2008010109A1Equipment management systemNEC ELECTRONICS CORP·Filed 2007·Application pending·0 cites
- 1147US2009234482A1System, program and method for calculating equipment load factorNEC ELECTRONICS CORP·Filed 2009·Application pending·0 cites
- 1245US6348397B2Method for diffusion of an impurity into a semiconductor wafer with high in-plane diffusion uniformityNEC CORP·Filed 1999·Granted Feb 19, 2002·10 cites·2 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →