Inventor · disambiguated record
Shingo Imanishi
Also filed as: IMANISHI SHINGO
33 granted patents·3 pending applications·362 citations·filing 1998–2020
97Inventor score
Top patents by PatentIndex Score
36 records- 0195US7171676B2Stamper for producing optical recording medium, optical recording medium, and methods of producing the sameSONY CORP·Filed 2005·Granted Jan 30, 2007·23 cites·10 claims
- 0295US6442110B1Beam irradiation apparatus, optical apparatus having beam irradiation apparatus for information recording medium, method for manufacturing original disk for information recording medium, and method for manufacturing information recording mediumSONY CORP·Filed 1999·Granted Aug 27, 2002·104 cites·32 claims
- 0394US10591400B2Micro particle analyzer and micro particle analysis methodSONY CORP·Filed 2019·Granted Mar 17, 2020·5 cites·6 claims
- 0494US6971116B2Stamper for producing optical recording medium, optical recording medium, and methods of producing the sameSONY CORP·Filed 2002·Granted Nov 29, 2005·42 cites·3 claims
- 0590US6717896B1Controlling a gap length in a near-field area in an exposure apparatusSONY CORP·Filed 2000·Granted Apr 6, 2004·33 cites·18 claims
- 0687US8487273B2Microchip and particulate fractional collection apparatusITO TATSUMI·Filed 2011·Granted Jul 16, 2013·15 cites·14 claims
- 0785US8780338B2Optical measuring device and optical measuring methodSUZUKI SHUNPEI·Filed 2011·Granted Jul 15, 2014·9 cites·9 claims
- 0881US8994940B2Fine particle measurement apparatus and optical axis calibration methodDOWAKI SUGURU·Filed 2011·Granted Mar 31, 2015·5 cites·2 claims
- 0980US6798493B2Photolithography apparatus and exposure methodSONY CORP·Filed 2003·Granted Sep 28, 2004·14 cites·20 claims
- 1079US8467055B2Optical measuring deviceIMANISHI SHINGO·Filed 2009·Granted Jun 18, 2013·14 cites·12 claims
- 1177US9766174B2Optical measuring device and optical measuring methodSONY CORP·Filed 2014·Granted Sep 19, 2017·2 cites·14 claims
- 1277US6738323B1Optical disc apparatus and focusing control method in an optical disc apparatusSONY CORP·Filed 2000·Granted May 18, 2004·12 cites·9 claims
- 1376US9429508B2Microparticle measuring apparatusSONY CORP·Filed 2013·Granted Aug 30, 2016·2 cites·11 claims
- 1475US7821703B2Laser drawing method and apparatusSONY CORP·Filed 2008·Granted Oct 26, 2010·4 cites·11 claims
- 1575US7317668B2Information recording and/or reproducing apparatusSONY CORP·Filed 2007·Granted Jan 8, 2008·2 cites·5 claims
- 1674US7180833B2Information recording and/or reproducing apparatusSONY CORP·Filed 2003·Granted Feb 20, 2007·8 cites·16 claims
- 1773US6704096B1Exposure apparatus and exposure methodSONY CORP·Filed 2000·Granted Mar 9, 2004·9 cites·14 claims
- 1871US8553229B2Fine particle optical measuring method in fluidic channelsFURUKI MOTOHIRO·Filed 2008·Granted Oct 8, 2013·3 cites·3 claims
- 1970US8035815B2Optical detection method and optical detection apparatus for a fine particleSONY CORP·Filed 2008·Granted Oct 11, 2011·2 cites·16 claims
- 2068US11156544B2Microparticle analyzer and microparticle analysis methodSONY CORP·Filed 2020·Granted Oct 26, 2021·0 cites·23 claims
- 2168US8077313B2Optical measuring device, optical measuring apparatus and fine particle measuring apparatus using optical measuring deviceFURUKI MOTOHIRO·Filed 2008·Granted Dec 13, 2011·2 cites·7 claims
- 2263US6016302AOptical disc and method for producing sameSONY CORP·Filed 1998·Granted Jan 18, 2000·16 cites·7 claims
- 2361US9816913B2Microparticle measuring apparatusSONY CORP·Filed 2016·Granted Nov 14, 2017·0 cites·20 claims
- 2461US7099259B2Exposure apparatus, exposure method, recording and/or reproducing apparatus, and recording and/or reproducing methodSONY CORP·Filed 2003·Granted Aug 29, 2006·4 cites·49 claims
- 2560US6320839B1Optical information recording medium, optical information recording method and optical information recording apparatusSONY CORP·Filed 1998·Granted Nov 20, 2001·14 cites·6 claims
- 2658US7880879B2Optical measuring deviceSONY CORP·Filed 2009·Granted Feb 1, 2011·0 cites·5 claims
- 2756US8309000B2Method for manufacturing microlens and method for manufacturing solid-state image sensorFUJITA GORO·Filed 2009·Granted Nov 13, 2012·1 cites·9 claims
- 2852US2009231648A1Hologram substrate, method for producing same, and electronic deviceSONY CORP·Filed 2009·Application pending·0 cites
- 2951US8263956B2Optical flow channel measuring instrumentIMANISHI SHINGO·Filed 2009·Granted Sep 11, 2012·0 cites·8 claims
- 3049US10371632B2Data correction method in fine particle measuring device and fine particle measuring deviceSONY CORP·Filed 2013·Granted Aug 6, 2019·0 cites·19 claims
- 3148US6118574AExposure apparatusSONY CORP·Filed 1998·Granted Sep 12, 2000·15 cites·14 claims
- 3247US8545969B2Pattern-formed substrate, pattern-forming method, and dieIMANISHI SHINGO·Filed 2008·Granted Oct 1, 2013·0 cites·6 claims
- 3344US2006159001A1Mastering apparatus, mastering method and optical recording mediumIMANISHI SHINGO·Filed 2006·Application pending·0 cites
- 3443US6466538B1Optical recording medium having disconnected land and groove forming control portionSONY CORP·Filed 2000·Granted Oct 15, 2002·0 cites·2 claims
- 3536US6136402AOptical recording medium having disconnected lands and grooves forming control signal portionSONY CORP·Filed 1998·Granted Oct 24, 2000·2 cites·4 claims
- 3632US2004051052A1Method for manufacturing original disk for recording medium, and stamper manufacturing methodFiled 2002·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →