Inventor · disambiguated record
Shoichi Inoue
Also filed as: INOUE SHOICHI · TANIYAMA SUSUMU
12 granted patents·185 citations·filing 1978–2016
92Inventor score
Files withMITSUBISHI GAS CHEMICAL CO4CANON KK2TAIHEI SEISAKUSHO KK2INOUE SHOICHI1OLYMPUS OPTICAL CO1
Top patents by PatentIndex Score
12 records- 0182US4241116AMethod of treating the surfaces of shaped articles of polycarbonate resinsMITSUBISHI GAS CHEMICAL CO·Filed 1979·Granted Dec 23, 1980·34 cites·3 claims
- 0279US4278783AMethod of curing an organoalkoxysilane compoundMITSUBISHI GAS CHEMICAL CO·Filed 1979·Granted Jul 14, 1981·25 cites·6 claims
- 0375US4196014ASurface-treating paint for shaped plastic articlesMITSUBISHI GAS CHEMICAL CO·Filed 1978·Granted Apr 1, 1980·24 cites·6 claims
- 0469US4707159ASerial printer including a laterally reciprocable recording head, paper bail control, paper detection and feeding means, a multicolor ink ribbon including a head cleaning zone, a ribbon cassette and ribbon shift meansCANON KK·Filed 1985·Granted Nov 17, 1987·20 cites·14 claims
- 0562US4863552AHorizontal multistage pressTAIHEI SEISAKUSHO KK·Filed 1987·Granted Sep 5, 1989·17 cites·28 claims
- 0658US4167537ASurface-treating coating composition for plastic articlesMITSUBISHI GAS CHEMICAL CO·Filed 1978·Granted Sep 11, 1979·13 cites·6 claims
- 0756US4846925AHorizontal multiplaten pressTAIHEI SEISAKUSHO KK·Filed 1987·Granted Jul 11, 1989·13 cites·12 claims
- 0851US8857795B2Tiltable support post structurePROTEC ENGINEERING INC·Filed 2012·Granted Oct 14, 2014·2 cites·8 claims
- 0950US10030342B2Impact-absorbing levee-shaped structurePROTEC ENG INC·Filed 2016·Granted Jul 24, 2018·1 cites·4 claims
- 1050US4912845AShaverINOUE SHOICHI·Filed 1988·Granted Apr 3, 1990·21 cites·7 claims
- 1143US6567189B1Image reading apparatusCANON KK·Filed 1999·Granted May 20, 2003·10 cites·18 claims
- 1234US5084158AFlow cell for electrolyte measuring deviceOLYMPUS OPTICAL CO·Filed 1990·Granted Jan 28, 1992·5 cites·10 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →