Inventor · disambiguated record
Shigeru Izawa
Also filed as: IZAWA SHIGERU
12 granted patents·1 pending application·124 citations·filing 1974–2010
92Inventor score
Top patents by PatentIndex Score
13 records- 0191US7420181B2Liquid metal ion gunHITACHI HIGH TECH CORP·Filed 2007·Granted Sep 2, 2008·10 cites·13 claims
- 0288US7211805B2Liquid metal ion gunHITACHI HIGH TECH CORP·Filed 2005·Granted May 1, 2007·8 cites·3 claims
- 0386US7189982B2Focused ion beam apparatus and apertureHITACHI HIGH TECH CORP·Filed 2005·Granted Mar 13, 2007·8 cites·10 claims
- 0484US7804073B2Liquid metal ion gunHITACHI HIGH TECH CORP·Filed 2008·Granted Sep 28, 2010·5 cites·13 claims
- 0582US7005651B2Liquid metal ion gunHITACHI HIGH TECH CORP·Filed 2004·Granted Feb 28, 2006·12 cites·8 claims
- 0676US7875156B2Probe storage container, prober apparatus, probe arranging method and manufacturing method of probe storage containerHITACHI HIGH TECH CORP·Filed 2008·Granted Jan 25, 2011·7 cites·6 claims
- 0774US5012092AMethod and apparatus for fine movement of specimen stage of electron microscopeHITACHI LTD·Filed 1989·Granted Apr 30, 1991·35 cites·12 claims
- 0872US7435972B2Focused ion beam apparatus and liquid metal ion sourceHITACHI HIGH TECH CORP·Filed 2007·Granted Oct 14, 2008·2 cites·8 claims
- 0955US5027337AOptical recording medium and tracking method thereforCSK CORP·Filed 1990·Granted Jun 25, 1991·12 cites·4 claims
- 1047US3935645AApparatus for indicating relative azimuthKOMATSU MFG CO LTD·Filed 1974·Granted Feb 3, 1976·7 cites·3 claims
- 1145US2011093991A1Probe Storage Container, Prober Apparatus, Probe Arranging Method and Manufacturing Method of Probe Storage ContainerHITACHI HIGH TECH CORP·Filed 2010·Application pending·0 cites
- 1244US4881214AData record formatting system and reading/writing system for optical recording mediumCSK CORP·Filed 1987·Granted Nov 14, 1989·7 cites·12 claims
- 1342US5067812ASystems for inspecting defects in an optical recording mediumCSK CORP·Filed 1989·Granted Nov 26, 1991·11 cites·5 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →