Inventor · disambiguated record
Shinjiro Kondo
Also filed as: KONDO SHINJIRO
4 granted patents·101 citations·filing 1995–2010
75Inventor score
Top patents by PatentIndex Score
4 records- 0194US5615006AImaging characteristic and asymetric abrerration measurement of projection optical systemNIKON CORP·Filed 1995·Granted Mar 25, 1997·89 cites·11 claims
- 0281US8343693B2Focus test mask, focus measurement method, exposure method and exposure apparatusNIKON CORP·Filed 2010·Granted Jan 1, 2013·4 cites·25 claims
- 0371US7426017B2Focus test mask, focus measurement method and exposure apparatusNIKON CORP·Filed 2005·Granted Sep 16, 2008·4 cites·29 claims
- 0463US8339614B2Method of measuring shot shape and maskKONDO SHINJIRO·Filed 2006·Granted Dec 25, 2012·4 cites·8 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →