Inventor · disambiguated record
Shigetaka Kumashiro
Also filed as: KUMASHIRO SHIGETAKA
15 granted patents·1 pending application·172 citations·filing 1994–2003
93Inventor score
Top patents by PatentIndex Score
16 records- 0167US5677846ADevice simulator and mesh generating method thereofNEC CORP·Filed 1994·Granted Oct 14, 1997·45 cites·9 claims
- 0266US6553340B1Computer simulation method for semiconductor deviceNEC ELECTRONICS CORP·Filed 2000·Granted Apr 22, 2003·12 cites·2 claims
- 0362US6566695B2Hyperbolic type channel MOSFETNEC ELECTRONICS CORP·Filed 2001·Granted May 20, 2003·10 cites·5 claims
- 0450US6505147B1Method for process simulationNEC CORP·Filed 1999·Granted Jan 7, 2003·23 cites·19 claims
- 0549US6360190B1Semiconductor process device simulation method and storage medium storing simulation programNEC CORP·Filed 1998·Granted Mar 19, 2002·24 cites·2 claims
- 0648US6426535B1Semiconductor device having improved short channel resistanceNEC CORP·Filed 1999·Granted Jul 30, 2002·13 cites·8 claims
- 0745US6931609B2Capacitance parameters calculation method for MOSFET and program thereforNEC ELECTRONICS CORP·Filed 2003·Granted Aug 16, 2005·1 cites·9 claims
- 0840US2001002707A1Apparatus and method for simulating MOSFETFiled 2000·Application pending·0 cites
- 0936US6144929AMethod of simulating impact ionization phenomenon in semiconductor deviceNEC CORP·Filed 1998·Granted Nov 7, 2000·8 cites·7 claims
- 1034US6154717AComputer simulation method of impurity with pileup phenomenonNEC CORP·Filed 1998·Granted Nov 28, 2000·7 cites·20 claims
- 1134US5784302AHigh speed point defect diffusion simulating methodNEC CORP·Filed 1996·Granted Jul 21, 1998·7 cites·10 claims
- 1233US6242272B1Reverse profiling method for profiling modulated impurity density distribution of semiconductor deviceNEC CORP·Filed 1999·Granted Jun 5, 2001·3 cites·7 claims
- 1333US6080200ADiffusion simulation method for impurities using mesh points and branches utilizing concentrations of electrically active impurities and effective impurity electric field mobilityNEC CORP·Filed 1998·Granted Jun 27, 2000·6 cites·9 claims
- 1433US6006026AMethod for simulating impurity diffusion in semiconductor with oxidationNEC CORP·Filed 1997·Granted Dec 21, 1999·5 cites·12 claims
- 1531US5682338AMethod of estimating initial values of potential in semiconductor device simulationNEC CORP·Filed 1995·Granted Oct 28, 1997·6 cites·13 claims
- 1630US5847973AOxidation simulation methodNEC CORP·Filed 1997·Granted Dec 8, 1998·2 cites·6 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →