Inventor · disambiguated record
Shunsuke Kurata
Also filed as: KURATA SHUNSUKE
10 granted patents·2 pending applications·159 citations·filing 2001–2008
89Inventor score
Top patents by PatentIndex Score
12 records- 0192US6549825B2Alignment apparatusOLYMPUS OPTICAL CO·Filed 2002·Granted Apr 15, 2003·77 cites·9 claims
- 0284US7102743B2Semiconductor wafer inspection apparatusOLYMPUS CORP·Filed 2004·Granted Sep 5, 2006·26 cites·8 claims
- 0375US7456947B2Inspecting apparatus and inspecting methodOLYMPUS CORP·Filed 2005·Granted Nov 25, 2008·5 cites·10 claims
- 0472US6549290B2Method and apparatus for aligning target objectOLYMPUS OPTICAL CO·Filed 2001·Granted Apr 15, 2003·16 cites·18 claims
- 0571US7369237B2Substrate processing apparatus and substrate processing systemOLYMPUS CORP·Filed 2005·Granted May 6, 2008·4 cites·16 claims
- 0669US7053393B2Alignment apparatus for object on stageOLYMPUS CORP·Filed 2003·Granted May 30, 2006·9 cites·15 claims
- 0765US7308329B2Method and apparatus for inspecting semiconductor waferOLYMPUS CORP·Filed 2005·Granted Dec 11, 2007·6 cites·12 claims
- 0865US6710320B2Small sized imaging device which detects position information and image informationOLYMPUS OPTICAL CO·Filed 2002·Granted Mar 23, 2004·11 cites·9 claims
- 0962US7365295B2Image inspection system for correcting focal position in autofocusingOLYMPUS CORP·Filed 2005·Granted Apr 29, 2008·3 cites·9 claims
- 1048US7084383B2Image processing apparatusOLYMPUS CORP·Filed 2003·Granted Aug 1, 2006·2 cites·21 claims
- 1146US2008239301A1Visual inspection apparatusOLYMPUS CORP·Filed 2008·Application pending·0 cites
- 1242US2007164194A1Observation apparatus with focal position control mechanismOLYMPUS CORP·Filed 2007·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →