Inventor · disambiguated record
Shang-Ju Lee
Also filed as: LEE SHANG JU
4 granted patents·6 citations·filing 2013–2022
65Inventor score
Top patents by PatentIndex Score
4 records- 0189US11808805B1Heterogenous voltage-based testing via on-chip voltage regulator circuitsNVIDIA CORP·Filed 2022·Granted Nov 7, 2023·2 cites·20 claims
- 0277US11328112B1Timing-aware testingNVIDIA CORP·Filed 2021·Granted May 10, 2022·1 cites·25 claims
- 0366US10622272B1Semiconductor chip structure and semiconductor packageADVANCED SEMICONDUCTOR ENG·Filed 2018·Granted Apr 14, 2020·2 cites·20 claims
- 0463US9448285B2Method and apparatus of wafer testingTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2013·Granted Sep 20, 2016·1 cites·18 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →