Inventor · disambiguated record
Shun-Yi Lee
Also filed as: LEE SHUN-YI
18 granted patents·112 citations·filing 1995–2021
93Inventor score
Top patents by PatentIndex Score
18 records- 0194US11864376B2Semiconductor device including insulating element and method of makingTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Jan 2, 2024·2 cites·20 claims
- 0292US9893070B2Semiconductor device and fabrication method thereforTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2016·Granted Feb 13, 2018·7 cites·20 claims
- 0390US11270952B2Seal ring structure for semiconductor deviceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted Mar 8, 2022·6 cites·19 claims
- 0489US10157856B2Seal ring structure and fabrication method thereforTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2016·Granted Dec 18, 2018·6 cites·12 claims
- 0587US11088145B2Semiconductor device including insulating elementTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Aug 10, 2021·3 cites·20 claims
- 0671US12489065B2Fabrication method of semiconductor structureTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Dec 2, 2025·0 cites·20 claims
- 0769US6315021B1Labeling machineBOMA TECHNOLOGY CO LTD·Filed 2000·Granted Nov 13, 2001·15 cites·7 claims
- 0864US10147719B2Semiconductor field effect transistors and manufacturing method thereofTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2016·Granted Dec 4, 2018·1 cites·16 claims
- 0964US6147361APolysilicon electromigration sensor which can detect and monitor electromigration in composite metal lines on integrated circuit structures with improved sensitivityTAIWAN SEMICONDUCTOR MFG·Filed 1998·Granted Nov 14, 2000·30 cites·11 claims
- 1062US11764256B2Semiconductor structure including MIM capacitorTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Sep 19, 2023·0 cites·20 claims
- 1162US5627101AMethod of fabricating polysilicon electromigration sensor which can detect and monitor electromigration in composite metal lines on integrated circuit structuresTAIWAN SEMICONDUCTOR MFG·Filed 1995·Granted May 6, 1997·25 cites·19 claims
- 1259US10461085B2Semiconductor device including insulating elementTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted Oct 29, 2019·0 cites·17 claims
- 1356US10825894B2MIM capacitor and method of manufacturing the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted Nov 3, 2020·0 cites·20 claims
- 1456US9356016B2Semiconductor device and method for manufacturing the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2014·Granted May 31, 2016·0 cites·17 claims
- 1551US9601373B2Semiconductor device and method for manufacturing the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2016·Granted Mar 21, 2017·0 cites·19 claims
- 1641US5846848APolysilicon electromigration sensor which can detect and monitor electromigration in composite metal lines on integrated circuit structures with improved sensitivityTAIWAN SEMICONDUCTOR MFG·Filed 1997·Granted Dec 8, 1998·8 cites·4 claims
- 1739US6148891ACD labeling deviceBOMA TECHNOLOGY CO LTD·Filed 1998·Granted Nov 21, 2000·9 cites·13 claims
- 1838US10037990B2Method of manufacturing interconnect layer and semiconductor device which includes interconnect layerTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2016·Granted Jul 31, 2018·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →