Inventor · disambiguated record
Shimon Levi
Also filed as: LEVI SHIMON
9 granted patents·77 citations·filing 1996–2020
85Inventor score
Files withAPPLIED MATERIALS ISRAEL LTD8
Top patents by PatentIndex Score
9 records- 0194US9530199B1Technique for measuring overlay between layers of a multilayer structureAPPLIED MATERIALS ISRAEL LTD·Filed 2015·Granted Dec 27, 2016·12 cites·15 claims
- 0292US10354376B2Technique for measuring overlay between layers of a multilayer structureAPPLIED MATERIALS ISRAEL LTD·Filed 2018·Granted Jul 16, 2019·5 cites·20 claims
- 0383US9916652B2Technique for measuring overlay between layers of a multilayer structureAPPLIED MATERIALS ISRAEL LTD·Filed 2016·Granted Mar 13, 2018·2 cites·20 claims
- 0480US5628667ASinuous toyFiled 1996·Granted May 13, 1997·52 cites·17 claims
- 0575US9165376B2System, method and computer readable medium for detecting edges of a patternAPPLIED MATERIALS ISRAEL LTD·Filed 2013·Granted Oct 20, 2015·6 cites·20 claims
- 0663US11301983B2Measuring height difference in patterns on semiconductor wafersAPPLIED MATERIALS ISRAEL LTD·Filed 2020·Granted Apr 12, 2022·0 cites·20 claims
- 0753US10748272B2Measuring height difference in patterns on semiconductor wafersAPPLIED MATERIALS ISRAEL LTD·Filed 2018·Granted Aug 18, 2020·0 cites·20 claims
- 0844US11651509B2Method, system and computer program product for 3D-NAND CDSEM metrologyAPPLIED MATERIALS ISRAEL LTD·Filed 2019·Granted May 16, 2023·0 cites·11 claims
- 0940US10731979B2Method for monitoring nanometric structuresAPPLIED MATERIALS ISRAEL LTD·Filed 2018·Granted Aug 4, 2020·0 cites·19 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →