Inventor · disambiguated record
Shunzi Maeda
Also filed as: MAEDA SHUNZI
6 granted patents·29 citations·filing 2002–2012
80Inventor score
Technology areasG01N
Top patents by PatentIndex Score
6 records- 0182US6831737B2Apparatus and method for inspecting patternHITACHI LTD·Filed 2002·Granted Dec 14, 2004·14 cites·24 claims
- 0280US7081953B2Apparatus and method for inspecting patternHITACHI LTD·Filed 2004·Granted Jul 25, 2006·11 cites·10 claims
- 0378US7911601B2Apparatus and method for inspecting patternHITACHI LTD·Filed 2008·Granted Mar 22, 2011·3 cites·8 claims
- 0474US8149395B2Apparatus and method for inspecting patternUTO SACHIO·Filed 2011·Granted Apr 3, 2012·1 cites·13 claims
- 0559US8451439B2Apparatus and method for inspecting patternUTO SACHIO·Filed 2012·Granted May 28, 2013·0 cites·13 claims
- 0657US7446866B2Apparatus and method for inspecting patternHITACHI LTD·Filed 2006·Granted Nov 4, 2008·0 cites·9 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →