Inventor · disambiguated record
Shinichiro Miyahara
Also filed as: MIYAHARA SHINICHIRO
25 granted patents·13 pending applications·131 citations·filing 1990–2025
94Inventor score
Top patents by PatentIndex Score
38 records- 0195US9136372B2Silicon carbide semiconductor deviceMIYAHARA SHINICHIRO·Filed 2012·Granted Sep 15, 2015·37 cites·1 claims
- 0284US7060963B2Organism information measuring device and organism information measuring methodSEIKO INSTR INC·Filed 2005·Granted Jun 13, 2006·41 cites·11 claims
- 0382US9793376B2Silicon carbide semiconductor device and method of manufacturing the sameDENSO CORP·Filed 2013·Granted Oct 17, 2017·5 cites·5 claims
- 0481US8575689B2Silicon carbide semiconductor device and manufacturing method of the sameMIMURA TOMOHIRO·Filed 2011·Granted Nov 5, 2013·9 cites·3 claims
- 0579US8334541B2SiC semiconductor deviceMIYAHARA SHINICHIRO·Filed 2011·Granted Dec 18, 2012·6 cites·10 claims
- 0676US8470672B2Method of manufacturing silicon carbide semiconductor deviceENDO TAKESHI·Filed 2011·Granted Jun 25, 2013·4 cites·8 claims
- 0776US2025351473A1Semiconductor device and method for manufacturing the sameDENSO CORP·Filed 2025·Application pending·0 cites
- 0867US9024330B2Semiconductor device and manufacturing method thereofWATANABE YUKIHIKO·Filed 2013·Granted May 5, 2015·3 cites·4 claims
- 0966US8525223B2Silicon carbide semiconductor deviceWATANABE HIROKI·Filed 2012·Granted Sep 3, 2013·2 cites·7 claims
- 1065US12432989B2Semiconductor device and method for manufacturing the sameDENSO CORP·Filed 2022·Granted Sep 30, 2025·0 cites·7 claims
- 1164US7692591B2Portable electronic apparatusSEIKO INSTR INC·Filed 2005·Granted Apr 6, 2010·4 cites·23 claims
- 1262US8975139B2Manufacturing method of silicon carbide semiconductor deviceMIYAHARA SHINICHIRO·Filed 2012·Granted Mar 10, 2015·1 cites·17 claims
- 1362US7928830B2Biometric information detecting apparatusSEIKO INSTR INC·Filed 2005·Granted Apr 19, 2011·2 cites·20 claims
- 1457US8096953B2Organism information detecting apparatusNAKAMURA TAKASHI·Filed 2005·Granted Jan 17, 2012·1 cites·20 claims
- 1556US2024079492A1Semiconductor deviceDENSO CORP·Filed 2023·Application pending·0 cites
- 1654US2009240520A1Health care system, biological information terminalTAKANO KAORI·Filed 2004·Application pending·0 cites
- 1746US10181517B2Silicon carbide single crystal, silicon carbide single crystal wafer, silicon carbide single crystal epitaxial wafer, and electronic deviceDENSO CORP·Filed 2016·Granted Jan 15, 2019·0 cites·13 claims
- 1845US9698017B2Manufacturing method of semiconductor deviceTOYOTA MOTOR CO LTD·Filed 2016·Granted Jul 4, 2017·0 cites·8 claims
- 1943US5187720ASynchronous serial communication circuitSEIKO INSTR INC·Filed 1990·Granted Feb 16, 1993·15 cites·3 claims
- 2042US9941366B2Semiconductor device and manufacturing method of semiconductor deviceONOGI ATSUSHI·Filed 2014·Granted Apr 10, 2018·0 cites·1 claims
- 2139US10784335B2Silicon carbide semiconductor device and manufacturing method thereforDENSO CORP·Filed 2017·Granted Sep 22, 2020·0 cites·10 claims
- 2238US10153350B2Semiconductor deviceTOYOTA MOTOR CO LTD·Filed 2015·Granted Dec 11, 2018·0 cites·3 claims
- 2338US10068972B2Semiconductor device with opposite conductivity-type impurity regions between source and trench gate for reducing leakageTOYOTA MOTOR CO LTD·Filed 2016·Granted Sep 4, 2018·0 cites·8 claims
- 2438US9905686B2Insulated gate bipolar transistor with improved on/off resistanceTOYOTA MOTOR CO LTD·Filed 2016·Granted Feb 27, 2018·0 cites·1 claims
- 2537US2012181551A1Silicon carbide semiconductor deviceMIYAHARA SHINICHIRO·Filed 2012·Application pending·0 cites
- 2636US9633901B2Method for manufacturing semiconductor deviceTOYOTA MOTOR CO LTD·Filed 2015·Granted Apr 25, 2017·0 cites·10 claims
- 2735US9972674B2Schottky barrier diode and manufacturing method thereofTOYOTA MOTOR CO LTD·Filed 2015·Granted May 15, 2018·0 cites·4 claims
- 2835US2016300960A1Diode and method of manufacturing diodeTOYOTA MOTOR CO LTD·Filed 2016·Application pending·0 cites
- 2934US9847414B2Semiconductor device and method for manufacturing semiconductor device having a step provided in a lateral surface of a trench formed in a surface of a semiconductor substrateTOYOTA MOTOR CO LTD·Filed 2015·Granted Dec 19, 2017·0 cites·5 claims
- 3034US2016149029A1Semiconductor device and method for manufacturing semiconductor deviceTOYOTA MOTOR CO LTD·Filed 2015·Application pending·0 cites
- 3134US2016211349A1Semiconductor device and a method for manufacturing a semiconductor deviceTOYOTA MOTOR CO LTD·Filed 2016·Application pending·0 cites
- 3234US2018286974A1Semiconductor device and manufacturing method thereofTOYOTA MOTOR CO LTD·Filed 2016·Application pending·0 cites
- 3334US2016218190A1Semiconductor device and method for manufacturing semiconductor deviceTOYOTA MOTOR CO LTD·Filed 2016·Application pending·0 cites
- 3434US2016087094A1Semiconductor deviceTOYOTA MOTOR CO LTD·Filed 2015·Application pending·0 cites
- 3533US2017213907A1Switching deviceTOYOTA MOTOR CO LTD·Filed 2015·Application pending·0 cites
- 3633US2017309716A1Seminconductor device and manufacturing method of the sameTOYOTA MOTOR CO LTD·Filed 2015·Application pending·0 cites
- 3730US2017012136A1Semiconductor device and manufacturing method thereofTOYOTA MOTOR CO LTD·Filed 2016·Application pending·0 cites
- 3829US5187441APortable information apparatus for sensing battery voltage dropSEIKO INSTR INC·Filed 1990·Granted Feb 16, 1993·1 cites·9 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →