Inventor · disambiguated record
Shahriar Mostarshed
Also filed as: MOSTARSHED SHAHRIAR
11 granted patents·2 pending applications·433 citations·filing 2003–2010
92Inventor score
Top patents by PatentIndex Score
13 records- 0198US7105428B2Systems and methods for nanowire growth and harvestingNANOSYS INC·Filed 2005·Granted Sep 12, 2006·197 cites·38 claims
- 0296US7871870B2Method of fabricating gate configurations for an improved contacts in nanowire based electronic devicesNANOSYS INC·Filed 2010·Granted Jan 18, 2011·24 cites·21 claims
- 0396US7560366B1Nanowire horizontal growth and substrate removalNANOSYS INC·Filed 2005·Granted Jul 14, 2009·57 cites·23 claims
- 0495US7473943B2Gate configuration for nanowire electronic devicesNANOSYS INC·Filed 2005·Granted Jan 6, 2009·47 cites·11 claims
- 0594US7273732B2Systems and methods for nanowire growth and harvestingNANOSYS INC·Filed 2006·Granted Sep 25, 2007·22 cites·10 claims
- 0693US7701014B2Gating configurations and improved contacts in nanowire-based electronic devicesNANOSYS INC·Filed 2008·Granted Apr 20, 2010·23 cites·2 claims
- 0792US7951422B2Methods for oriented growth of nanowires on patterned substratesNANOSYS INC·Filed 2006·Granted May 31, 2011·23 cites·37 claims
- 0891US7126361B1Vertical probe card and air cooled probe head systemQUALITAU INC·Filed 2005·Granted Oct 24, 2006·32 cites·23 claims
- 0978US7666791B2Systems and methods for nanowire growth and harvestingNANOSYS INC·Filed 2007·Granted Feb 23, 2010·4 cites·5 claims
- 1061US7511517B2Semi-automatic multiplexing system for automated semiconductor wafer testingQUALITAU INC·Filed 2005·Granted Mar 31, 2009·1 cites·8 claims
- 1159US7576550B2Automatic multiplexing system for automated wafer testingQUALITAU INC·Filed 2007·Granted Aug 18, 2009·3 cites·8 claims
- 1236US2010167512A1Methods for Nanostructure DopingNANOSYS INC·Filed 2010·Application pending·0 cites
- 1334US2004136866A1Planar nanowire based sensor elements, devices, systems and methods for using and making sameNANOSYS INC·Filed 2003·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →