Inventor · disambiguated record
Shigeyuki Murai
Also filed as: MURAI SHIGEYUKI
10 granted patents·3 pending applications·81 citations·filing 1992–2005
88Inventor score
Top patents by PatentIndex Score
13 records- 0175US6627967B2Schottky barrier diodeSANYO ELECTRIC CO·Filed 2002·Granted Sep 30, 2003·21 cites·17 claims
- 0267US6786408B2Coin-type IC car reader/writerNIPPON CONLUX CO LTD·Filed 2001·Granted Sep 7, 2004·14 cites·11 claims
- 0365US6777277B2Manufacturing method of Schottky barrier diodeSANYO ELECTRIC CO·Filed 2002·Granted Aug 17, 2004·11 cites·18 claims
- 0451US6682968B2Manufacturing method of Schottky barrier diodeSANYO ELECTRIC CO·Filed 2002·Granted Jan 27, 2004·5 cites·23 claims
- 0550US6787871B2Integrated schottky barrier diode and manufacturing method thereofSANYO ELECTRIC CO·Filed 2002·Granted Sep 7, 2004·5 cites·7 claims
- 0648US5324969AHigh-breakdown voltage field-effect transistorSANYO ELECTRIC CO·Filed 1992·Granted Jun 28, 1994·13 cites·13 claims
- 0736US6818492B2Semiconductor device and manufacturing method thereofSANYO ELECTRIC CO·Filed 2001·Granted Nov 16, 2004·1 cites·9 claims
- 0836US5528509AMethod of designing a high-frequency circuitSANYO ELECTRIC CO·Filed 1994·Granted Jun 18, 1996·8 cites·2 claims
- 0936US2005179106A1Schottky barrier diodeSANYO ELECTRIC CO·Filed 2005·Application pending·0 cites
- 1035US7399999B2Semiconductor deviceSANYO ELECTRIC CO·Filed 2004·Granted Jul 15, 2008·0 cites·5 claims
- 1135US2005116283A1Semiconductor deviceGIFU SANYO ELECTRONICS CO LTD·Filed 2004·Application pending·0 cites
- 1233US2003025175A1Schottky barrier diodeSANYO ELECTRIC CO·Filed 2002·Application pending·0 cites
- 1332US6617660B2Field effect transistor semiconductor and method for manufacturing the sameSANYO ELECTRIC CO·Filed 1999·Granted Sep 9, 2003·3 cites·9 claims
Join the waitlist — get patent alerts
Get an alert when Shigeyuki Murai files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →