Inventor · disambiguated record
Shridhar Champaknath Nath
Also filed as: NATH SHRIDHAR · NATH SHRIDHAR C · NATH SHRIDHAR CHAMPAKNATH
21 granted patents·6 pending applications·709 citations·filing 1994–2017
96Inventor score
Top patents by PatentIndex Score
27 records- 0196US7015690B2Omnidirectional eddy current probe and inspection systemGEN ELECTRIC·Filed 2004·Granted Mar 21, 2006·127 cites·19 claims
- 0294US6911826B2Pulsed eddy current sensor probes and inspection methodsGEN ELECTRIC·Filed 2003·Granted Jun 28, 2005·82 cites·27 claims
- 0392US7402999B2Pulsed eddy current pipeline inspection system and methodGEN ELECTRIC·Filed 2005·Granted Jul 22, 2008·20 cites·22 claims
- 0492US6670808B2Self reference eddy current probe, measurement system, and measurement methodGEN ELECTRIC·Filed 2001·Granted Dec 30, 2003·52 cites·39 claims
- 0590US10830206B2Methods for manufacturing wind turbine rotor blades and components thereofGEN ELECTRIC·Filed 2017·Granted Nov 10, 2020·5 cites·14 claims
- 0689US6812697B2Molded eddy current array probeGEN ELECTRIC·Filed 2002·Granted Nov 2, 2004·44 cites·12 claims
- 0787US6707297B2Method for in-situ eddy current inspection of coated components in turbine enginesGEN ELECTRIC·Filed 2002·Granted Mar 16, 2004·31 cites·30 claims
- 0884US6720775B2Pulsed eddy current two-dimensional sensor array inspection probe and systemGEN ELECTRIC·Filed 2001·Granted Apr 13, 2004·25 cites·16 claims
- 0983US8436608B2Eddy current inspection system and methodSUN HAIYAN·Filed 2009·Granted May 7, 2013·12 cites·18 claims
- 1083US6545469B1Embedded eddy current inspection apparatus, system, and methodGEN ELECTRIC·Filed 2001·Granted Apr 8, 2003·23 cites·23 claims
- 1182US6888347B2Omnidirectional eddy current probes, array probes, and inspection systemsGEN ELECTRIC·Filed 2003·Granted May 3, 2005·19 cites·30 claims
- 1282US6414483B1Eddy current inspection method and apparatus for detecting flaws in an electrically conductive componentGEN ELECTRIC·Filed 2000·Granted Jul 2, 2002·25 cites·12 claims
- 1382US5698977AEddy current method for fatigue testingUS ARMY·Filed 1995·Granted Dec 16, 1997·56 cites·7 claims
- 1481US5617024AFlux focusing eddy current probeUS ARMY·Filed 1996·Granted Apr 1, 1997·57 cites·17 claims
- 1579US5648721ARotating flux-focusing eddy current probe for flaw detectionUS ARMY·Filed 1994·Granted Jul 15, 1997·49 cites·5 claims
- 1673US8240210B2Method and system for multimodal inspection with a coordinate measuring deviceWU YANYAN·Filed 2009·Granted Aug 14, 2012·7 cites·12 claims
- 1768US5847562AThickness gauging of single-layer conductive materials with two-point non linear calibration algorithmNASA·Filed 1997·Granted Dec 8, 1998·30 cites·16 claims
- 1860US6794963B2Magnetic device for a magnetic trip unitGEN ELECTRIC·Filed 2002·Granted Sep 21, 2004·12 cites·17 claims
- 1960US6429759B1Split and angled contactsGEN ELECTRIC·Filed 2000·Granted Aug 6, 2002·10 cites·16 claims
- 2059US5942894ARadially focused eddy current sensor for detection of longitudinal flaws in metallic tubesNASA·Filed 1995·Granted Aug 24, 1999·23 cites·20 claims
- 2152US2007222439A1Eddy current array probes with enhanced drive fieldsGEN ELECTRIC·Filed 2007·Application pending·0 cites
- 2250US2006132123A1Eddy current array probes with enhanced drive fieldsGEN ELECTRIC·Filed 2004·Application pending·0 cites
- 2346US2008278151A1System and methods for inspecting internal cracksGEN ELECTRIC·Filed 2007·Application pending·0 cites
- 2443US11022094B2Modular blade structure and method of assemblyGEN ELECTRIC·Filed 2017·Granted Jun 1, 2021·0 cites·18 claims
- 2542US2009158821A1Devices, methods and systems for measuring one or more characteristics of a suspensionGEN ELECTRIC·Filed 2007·Application pending·0 cites
- 2641US2017145986A1Custom fit blade tip for a rotor blade assembly of a wind turbine and method of fabricationGEN ELECTRIC·Filed 2015·Application pending·0 cites
- 2738US2006144162A1Method and apparatus for evaluating fluid flow in a heat exchangerBATZINGER THOMAS J·Filed 2005·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →