Inventor · disambiguated record
Sheng Nie
Also filed as: NIE SHENG CHAO
1 granted patent·1 pending application·7 citations·filing 2019–2019
29Inventor score
Files withYANGTZE MEMORY TECH CO LTD2
Top patents by PatentIndex Score
2 records- 0181US10823683B1Method for detecting defects in deep features with laser enhanced electron tunneling effectYANGTZE MEMORY TECH CO LTD·Filed 2019·Granted Nov 3, 2020·7 cites·10 claims
- 0236US2021109034A1Method for detecting defects in deep featuresYANGTZE MEMORY TECH CO LTD·Filed 2019·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →