Inventor · disambiguated record
Shane Nowell
Also filed as: NOWELL SHANE · NOWELL SHANE G
89 granted patents·6 pending applications·262 citations·filing 1996–2025
99Inventor score
Files withMICRON TECHNOLOGY INC73IOMEGA CORP14DPHI ACQUISITIONS INC3DATAPLAY INC2WESTERN DIGITAL TECH INC2
Top patents by PatentIndex Score
95 records- 0199US11340813B1Reliability scan assisted voltage bin selectionMICRON TECHNOLOGY INC·Filed 2020·Granted May 24, 2022·11 cites·20 claims
- 0299US11263134B1Block family combination and voltage bin selectionMICRON TECHNOLOGY INC·Filed 2020·Granted Mar 1, 2022·13 cites·20 claims
- 0398US11410734B1Voltage bin selection for blocks of a memory device after power up of the memory deviceMICRON TECHNOLOGY INC·Filed 2021·Granted Aug 9, 2022·8 cites·20 claims
- 0497US11676664B2Voltage bin selection for blocks of a memory device after power up of the memory deviceMICRON TECHNOLOGY INC·Filed 2022·Granted Jun 13, 2023·4 cites·20 claims
- 0597US11437108B1Voltage bin calibration based on a temporary voltage shift offsetMICRON TECHNOLOGY INC·Filed 2021·Granted Sep 6, 2022·5 cites·20 claims
- 0697US11404139B2Smart sampling for block family scanMICRON TECHNOLOGY INC·Filed 2020·Granted Aug 2, 2022·6 cites·20 claims
- 0797US11372545B2Managing bin placement for block families of a memory device based on trigger metric valuesMICRON TECHNOLOGY INC·Filed 2020·Granted Jun 28, 2022·6 cites·20 claims
- 0897US11132037B2Operating temperature management of a memory sub-systemMICRON TECHNOLOGY INC·Filed 2018·Granted Sep 28, 2021·11 cites·20 claims
- 0996US11886726B2Block family-based error avoidance for memory devicesMICRON TECHNOLOGY INC·Filed 2021·Granted Jan 30, 2024·3 cites·20 claims
- 1096US11593005B2Managing voltage bin selection for blocks of a memory deviceMICRON TECHNOLOGY INC·Filed 2021·Granted Feb 28, 2023·4 cites·20 claims
- 1196US11443830B1Error avoidance based on voltage distribution parameters of block familiesMICRON TECHNOLOGY INC·Filed 2021·Granted Sep 13, 2022·4 cites·20 claims
- 1296US11270772B1Voltage offset bin selection by die group for memory devicesMICRON TECHNOLOGY INC·Filed 2020·Granted Mar 8, 2022·5 cites·20 claims
- 1396US10553290B1Read disturb scan consolidationMICRON TECHNOLOGY INC·Filed 2018·Granted Feb 4, 2020·18 cites·20 claims
- 1495US11783901B2Multi-tier threshold voltage offset bin calibrationMICRON TECHNOLOGY INC·Filed 2022·Granted Oct 10, 2023·3 cites·20 claims
- 1595US11709727B2Managing error-handling flows in memory devicesMICRON TECHNOLOGY INC·Filed 2021·Granted Jul 25, 2023·3 cites·19 claims
- 1693US11231863B2Block family-based error avoidance for memory devicesMICRON TECHNOLOGY INC·Filed 2020·Granted Jan 25, 2022·3 cites·16 claims
- 1790US11587639B2Voltage calibration scans to reduce memory device overheadMICRON TECHNOLOGY INC·Filed 2021·Granted Feb 21, 2023·2 cites·20 claims
- 1888US11693745B2Error-handling flows in memory devices based on binsMICRON TECHNOLOGY INC·Filed 2020·Granted Jul 4, 2023·2 cites·20 claims
- 1988US11450391B2Multi-tier threshold voltage offset bin calibrationMICRON TECHNOLOGY INC·Filed 2020·Granted Sep 20, 2022·2 cites·19 claims
- 2087US10732890B2Adjusting a parameter for a programming operation based on the temperature of a memory systemMICRON TECHNOLOGY INC·Filed 2018·Granted Aug 4, 2020·5 cites·18 claims
- 2185US11163488B2Extended cross-temperature handling in a memory sub-systemMICRON TECHNOLOGY INC·Filed 2018·Granted Nov 2, 2021·3 cites·18 claims
- 2283US9600205B1Power aware power safe write bufferWESTERN DIGITAL TECH INC·Filed 2014·Granted Mar 21, 2017·7 cites·20 claims
- 2382US12393363B2Voltage bin calibration based on a voltage distribution reference voltageMICRON TECHNOLOGY INC·Filed 2024·Granted Aug 19, 2025·0 cites·20 claims
- 2482US12307111B2Block family-based error avoidance for memory devicesMICRON TECHNOLOGY INC·Filed 2023·Granted May 20, 2025·0 cites·20 claims
- 2581US11726689B2Time-based combining for block families of a memory deviceMICRON TECHNOLOGY INC·Filed 2020·Granted Aug 15, 2023·1 cites·18 claims
- 2680US11137808B2Temperature compensation in a memory systemMICRON TECHNOLOGY INC·Filed 2018·Granted Oct 5, 2021·2 cites·20 claims
- 2779US2024103749A1Providing recovered data to a new memory cell at a memory sub-system based on an unsuccessful error correction operationMICRON TECHNOLOGY INC·Filed 2023·Application pending·0 cites
- 2878US2025181259A1Block family-based error avoidance for memory devicesMICRON TECHNOLOGY INC·Filed 2025·Application pending·0 cites
- 2977US11966616B2Voltage bin calibration based on a voltage distribution reference voltageMICRON TECHNOLOGY INC·Filed 2023·Granted Apr 23, 2024·0 cites·20 claims
- 3077US11221912B2Mitigating an undetectable error when retrieving critical data during error handlingMICRON TECHNOLOGY INC·Filed 2020·Granted Jan 11, 2022·1 cites·20 claims
- 3176US12229000B2Managing error-handling flows in memory devicesMICRON TECHNOLOGY INC·Filed 2023·Granted Feb 18, 2025·0 cites·20 claims
- 3275US11941277B2Combination scan management for block families of a memory deviceMICRON TECHNOLOGY INC·Filed 2023·Granted Mar 26, 2024·0 cites·20 claims
- 3375US5930090AData cartridge with compression return spring following arcuate guideIOMEGA CORP·Filed 1997·Granted Jul 27, 1999·23 cites·20 claims
- 3475US2025147686A1Data recovery in memory devicesMICRON TECHNOLOGY INC·Filed 2025·Application pending·0 cites
- 3574US11928347B2Managing voltage bin selection for blocks of a memory deviceMICRON TECHNOLOGY INC·Filed 2023·Granted Mar 12, 2024·0 cites·20 claims
- 3674US10606698B2Mitigating an undetectable error when retrieving critical data during error handlingMICRON TECHNOLOGY INC·Filed 2018·Granted Mar 31, 2020·1 cites·20 claims
- 3772US11768619B2Voltage based combining of block families for memory devicesMICRON TECHNOLOGY INC·Filed 2022·Granted Sep 26, 2023·0 cites·20 claims
- 3872US11710527B2Mitigating a voltage condition of a memory cell in a memory sub-systemMICRON TECHNOLOGY INC·Filed 2022·Granted Jul 25, 2023·0 cites·20 claims
- 3971US11868639B2Providing recovered data to a new memory cell at a memory sub-system based on an unsuccessful error correction operationMICRON TECHNOLOGY INC·Filed 2021·Granted Jan 9, 2024·0 cites·18 claims
- 4071US11853556B2Combining sets of memory blocks in a memory deviceMICRON TECHNOLOGY INC·Filed 2022·Granted Dec 26, 2023·0 cites·20 claims
- 4171US11847317B2Managing bin placement for block families of a memory device based on trigger metric valvesMICRON TECHNOLOGY INC·Filed 2022·Granted Dec 19, 2023·0 cites·18 claims
- 4271US11733896B2Reliability scan assisted voltage bin selectionMICRON TECHNOLOGY INC·Filed 2022·Granted Aug 22, 2023·0 cites·20 claims
- 4370US11823748B2Voltage bin calibration based on a temporary voltage shift offsetMICRON TECHNOLOGY INC·Filed 2022·Granted Nov 21, 2023·0 cites·20 claims
- 4469US12057185B2Voltage calibration scans to reduce memory device overheadMICRON TECHNOLOGY INC·Filed 2022·Granted Aug 6, 2024·0 cites·20 claims
- 4569US11915776B2Error avoidance based on voltage distribution parameters of block familiesMICRON TECHNOLOGY INC·Filed 2022·Granted Feb 27, 2024·0 cites·20 claims
- 4669US11841753B2Operating temperature management of a memory sub-systemMICRON TECHNOLOGY INC·Filed 2021·Granted Dec 12, 2023·0 cites·12 claims
- 4769US11837307B2Managing error-handling flows in memory devicesMICRON TECHNOLOGY INC·Filed 2022·Granted Dec 5, 2023·0 cites·20 claims
- 4869US11720286B2Extended cross-temperature handling in a memory sub-systemMICRON TECHNOLOGY INC·Filed 2021·Granted Aug 8, 2023·0 cites·20 claims
- 4969US11620074B2Voltage bin calibration based on a voltage distribution reference voltageMICRON TECHNOLOGY INC·Filed 2021·Granted Apr 4, 2023·0 cites·20 claims
- 5069US5841605ACaddy for cartridge and disk drive accomodating a caddyIOMEGA CORP·Filed 1996·Granted Nov 24, 1998·22 cites·23 claims
Showing the top 50 of 95 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →