Inventor · disambiguated record
Shih-Yao Pan
Also filed as: PAN SHIH-YAO
6 granted patents·2 pending applications·0 citations·filing 2011–2024
62Inventor score
Top patents by PatentIndex Score
8 records- 0156US2025172384A1Method, measurement system, and computer-readable medium for measuring hole depth using phase extraction information from reflectance spectrumCHROMA ATE INC·Filed 2024·Application pending·0 cites
- 0249US12327767B2Optical inspection apparatus in semiconductor process systemCHROMA ATE INC·Filed 2021·Granted Jun 10, 2025·0 cites·12 claims
- 0348US12504325B2Automated optical measurement system and method for near eye displayCHROMA ATE INC·Filed 2024·Granted Dec 23, 2025·0 cites·4 claims
- 0447US11269170B2Separate microscopy system and adjusting method thereofCHROMA ATE INC·Filed 2019·Granted Mar 8, 2022·0 cites·10 claims
- 0541US2019257762A1Detection deviceCHROMA ATE INC·Filed 2019·Application pending·0 cites
- 0640US10436580B2Surface measurement systemCHROMA ATE INC·Filed 2018·Granted Oct 8, 2019·0 cites·6 claims
- 0737US8638445B2Imaging apparatus and method thereofLIN YU-HSUAN·Filed 2011·Granted Jan 28, 2014·0 cites·8 claims
- 0834US11841218B2System and method of measuring surface topographyPAN SHIH YAO·Filed 2021·Granted Dec 12, 2023·0 cites·4 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →