Inventor · disambiguated record

Shi Min Pan

Also filed as: Pan Shi Min

1 granted patent·0 citations·filing 2021–2021

1Inventor score

Technology areasG01N

Files withHARBIN INSTITUTE OF TECH SHENZHEN INSTITUTE OF SCIENCE AND TECH INNOVATION1

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1 record

0143US11703477B2Nondestructive testing method and device for detecting and distinguishing internal defect and external defect of wire ropeHARBIN INSTITUTE OF TECH SHENZHEN INSTITUTE OF SCIENCE AND TECH INNOVATION·Filed 2021·Granted Jul 18, 2023·0 cites·17 claims

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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →