Inventor · disambiguated record
Shehul Sailesh Parikh
Also filed as: PARIKH SHEHUL SAILESH
7 granted patents·106 citations·filing 2012–2021
87Inventor score
Top patents by PatentIndex Score
7 records- 0196US12174334B2Distributed analysis X-ray inspection methods and systemsRAPISCAN SYSTEMS INC·Filed 2021·Granted Dec 24, 2024·5 cites·22 claims
- 0292US10830920B2Distributed analysis X-ray inspection methods and systemsRAPISCAN SYSTEMS INC·Filed 2019·Granted Nov 10, 2020·7 cites·30 claims
- 0392US9111331B2X-ray inspection system that integrates manifest data with imaging/detection processingPARIKH SHEHUL SAILESH·Filed 2012·Granted Aug 18, 2015·65 cites·14 claims
- 0491US11099294B2Distributed analysis x-ray inspection methods and systemsRAPISCAN SYSTEMS INC·Filed 2019·Granted Aug 24, 2021·6 cites·43 claims
- 0591US9632206B2X-ray inspection system that integrates manifest data with imaging/detection processingRAPISCAN SYSTEMS INC·Filed 2015·Granted Apr 25, 2017·12 cites·14 claims
- 0690US10422919B2X-ray inspection system that integrates manifest data with imaging/detection processingRAPISCAN SYSTEMS INC·Filed 2017·Granted Sep 24, 2019·6 cites·14 claims
- 0786US10509142B2Distributed analysis x-ray inspection methods and systemsRAPISCAN SYSTEMS INC·Filed 2019·Granted Dec 17, 2019·5 cites·30 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →