Inventor · disambiguated record

Shichen Qu

Also filed as: QU SHICHEN

1 granted patent·7 citations·filing 2024–2024

29Inventor score

Technology areasY02P

Files withINST AUTOMATION CAS1

Top patents by PatentIndex Score

1 record

0186US12254612B1Method for constructing defect detection model, method for detecting defect and related apparatusINST AUTOMATION CAS·Filed 2024·Granted Mar 18, 2025·7 cites·10 claims

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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →