Inventor · disambiguated record
Shivananda Shetty
Also filed as: SHETTY SHIVANANDA · SHETTY SHIVANANDA S
33 granted patents·2 pending applications·62 citations·filing 2002–2025
95Inventor score
Files withADVANCED MICRO DEVICES INC12CYPRESS SEMICONDUCTOR CORP10Infineon Technologies LLC10NEO TIO WEI1SPANSION LLC1
Top patents by PatentIndex Score
35 records- 0193US12250815B1Methods of equalizing gate heights in embedded non-volatile memory on HKMG technologyInfineon Technologies LLC·Filed 2024·Granted Mar 11, 2025·1 cites·20 claims
- 0292US10068912B1Method of reducing charge loss in non-volatile memoriesCYPRESS SEMICONDUCTOR CORP·Filed 2017·Granted Sep 4, 2018·8 cites·20 claims
- 0383US11978528B2Dynamic sensing levels for nonvolatile memory devicesInfineon Technologies LLC·Filed 2022·Granted May 7, 2024·1 cites·20 claims
- 0481US9881683B1Suppression of program disturb with bit line and select gate voltage regulationCYPRESS SEMICONDUCTOR CORP·Filed 2017·Granted Jan 30, 2018·4 cites·18 claims
- 0578US11567691B2Continuous monotonic counter for memory devicesInfineon Technologies LLC·Filed 2020·Granted Jan 31, 2023·1 cites·20 claims
- 0677US9997253B1Non-volatile memory array with memory gate line and source line scramblingCYPRESS SEMICONDUCTOR CORP·Filed 2017·Granted Jun 12, 2018·3 cites·21 claims
- 0773US10685724B2Suppression of program disturb with bit line and select gate voltage regulationCYPRESS SEMICONDUCTOR CORP·Filed 2019·Granted Jun 16, 2020·2 cites·10 claims
- 0872US12444446B2Dynamic sensing levels for nonvolatile memory devicesInfineon Technologies LLC·Filed 2024·Granted Oct 14, 2025·0 cites·18 claims
- 0971US12131055B2Continuous monotonic counter for memory devicesInfineon Technologies LLC·Filed 2023·Granted Oct 29, 2024·0 cites·20 claims
- 1071US2025351343A1Methods of equalizing gate heights in embedded non-volatile memory on hkmg technologyInfineon Technologies LLC·Filed 2025·Application pending·0 cites
- 1166US6815233B1Method of simultaneous display of die and wafer characterization in integrated circuit technology developmentADVANCED MICRO DEVICES INC·Filed 2003·Granted Nov 9, 2004·10 cites·20 claims
- 1265US11081194B2Suppression of program disturb with bit line and select gate voltage regulationCYPRESS SEMICONDUCTOR CORP·Filed 2020·Granted Aug 3, 2021·0 cites·20 claims
- 1365US10229745B2Suppression of program disturb with bit line and select gate voltage regulationCYPRESS SEMICONDUCTOR CORP·Filed 2018·Granted Mar 12, 2019·1 cites·20 claims
- 1460US8724388B2Adaptively programming or erasing flash memory blocksNEO TIO WEI·Filed 2012·Granted May 13, 2014·3 cites·19 claims
- 1559US12481578B2Data loss protection for memory systems and devicesInfineon Technologies LLC·Filed 2023·Granted Nov 25, 2025·0 cites·20 claims
- 1659US12406747B2Memory location mapping and unmappingInfineon Technologies LLC·Filed 2023·Granted Sep 2, 2025·0 cites·21 claims
- 1757US7137085B1Wafer level global bitmap characterization in integrated circuit technology developmentADVANCED MICRO DEVICES INC·Filed 2004·Granted Nov 14, 2006·8 cites·20 claims
- 1855US2025315170A1System and Method for Generation of Unique Digital Signature Using a Non-Volatile Memory based Physical Unclonable FunctionInfineon Technologies LLC·Filed 2024·Application pending·0 cites
- 1953US10957703B2Method of reducing charge loss in non-volatile memoriesCYPRESS SEMICONDUCTOR CORP·Filed 2018·Granted Mar 23, 2021·0 cites·10 claims
- 2052US7155652B1Digital signal processing for real time classification of failure bitmaps in integrated circuit technology developmentADVANCED MICRO DEVICES INC·Filed 2003·Granted Dec 26, 2006·7 cites·12 claims
- 2151US10446245B2Non-volatile memory array with memory gate line and source line scramblingCYPRESS SEMICONDUCTOR CORP·Filed 2018·Granted Oct 15, 2019·0 cites·19 claims
- 2251US7634127B1Efficient storage of fail data to aid in fault isolationADVANCED MICRO DEVICES INC·Filed 2004·Granted Dec 15, 2009·4 cites·20 claims
- 2350US10192627B2Non-volatile memory array with memory gate line and source line scramblingCYPRESS SEMICONDUCTOR CORP·Filed 2018·Granted Jan 29, 2019·0 cites·21 claims
- 2450US8995198B1Multi-pass soft programmingSPANSION LLC·Filed 2013·Granted Mar 31, 2015·1 cites·20 claims
- 2547US6875560B1Testing multiple levels in integrated circuit technology developmentADVANCED MICRO DEVICES INC·Filed 2003·Granted Apr 5, 2005·1 cites·20 claims
- 2646US11935603B2Erase power loss indicator (EPLI) implementation in flash memory deviceInfineon Technologies LLC·Filed 2022·Granted Mar 19, 2024·0 cites·20 claims
- 2746US7263451B1Method and apparatus for correlating semiconductor process data with known prior process dataADVANCED MICRO DEVICES INC·Filed 2004·Granted Aug 28, 2007·1 cites·20 claims
- 2844US7197435B1Method and apparatus for using clustering method to analyze semiconductor devicesADVANCED MICRO DEVICES INC·Filed 2004·Granted Mar 27, 2007·2 cites·16 claims
- 2941US6864107B1Determination of nonphotolithographic wafer process-splits in integrated circuit technology developmentADVANCED MICRO DEVICES INC·Filed 2003·Granted Mar 8, 2005·0 cites·10 claims
- 3041US6766265B2Processing tester information by trellising in integrated circuit technology developmentADVANCED MICRO DEVICES INC·Filed 2002·Granted Jul 20, 2004·0 cites·20 claims
- 3140US6907379B1System and method for processing tester information and visualization for parameter with multiple distributions in integrated circuit technology developmentADVANCED MICRO DEVICES INC·Filed 2002·Granted Jun 14, 2005·2 cites·16 claims
- 3239US7099789B1Characterizing distribution signatures in integrated circuit technologyADVANCED MICRO DEVICES INC·Filed 2004·Granted Aug 29, 2006·1 cites·22 claims
- 3337US10679712B2Non-volatile memory device and method of blank checkCYPRESS SEMICONDUCTOR CORP·Filed 2018·Granted Jun 9, 2020·0 cites·21 claims
- 3435US6941529B1Method and system for using emission microscopy in physical verification of memory device architectureADVANCED MICRO DEVICES INC·Filed 2002·Granted Sep 6, 2005·1 cites·14 claims
- 3534US8725748B1Method and system for storing and retrieving semiconductor tester informationSUNDARARAJAN SRIKANTH·Filed 2004·Granted May 13, 2014·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →