Inventor · disambiguated record
Shiow-Hwan Sheu
Also filed as: SHEU SHIOW-HWAN
2 granted patents·72 citations·filing 2000–2000
65Inventor score
Files withPROMOS TECHNOLOGIES INC2
Top patents by PatentIndex Score
2 records- 0184US6507800B1Method for testing semiconductor wafersPROMOS TECHNOLOGIES INC·Filed 2000·Granted Jan 14, 2003·61 cites·20 claims
- 0256US6694208B1Method for prioritizing failure modes to improve yield rate in manufacturing semiconductor devicesPROMOS TECHNOLOGIES INC·Filed 2000·Granted Feb 17, 2004·11 cites·25 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →