Inventor · disambiguated record
Shiang-Ruei Su
Also filed as: SU SHIANG-RUEI
4 granted patents·2 citations·filing 2012–2019
60Inventor score
Top patents by PatentIndex Score
4 records- 0183US10495687B2Reliability testing methodTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2016·Granted Dec 3, 2019·2 cites·20 claims
- 0263US11226363B2Reliability testing method and apparatusTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Jan 18, 2022·0 cites·20 claims
- 0345US10847492B2Semiconductor structure and manufacturing method for the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted Nov 24, 2020·0 cites·20 claims
- 0444US9508617B2Test chip, test board and reliability testing methodSU SHIANG-RUEI·Filed 2012·Granted Nov 29, 2016·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →