Inventor · disambiguated record
Shinichiro Tsudaka
Also filed as: TSUDAKA SHINICHIRO
11 granted patents·2 pending applications·18 citations·filing 2004–2016
83Inventor score
Top patents by PatentIndex Score
13 records- 0172US10295996B2Test device for monitoring control deviceMITSUBISHI ELECTRIC CORP·Filed 2014·Granted May 21, 2019·3 cites·4 claims
- 0268US10359757B2Control logic diagram analysis device and control logic diagram analysis methodMITSUBISHI ELECTRIC CORP·Filed 2015·Granted Jul 23, 2019·1 cites·6 claims
- 0366US7362085B2Power line carrier communication system and its communication device, and method for constructing power line carrier communication systemMITSUBISHI ELECTRIC CORP·Filed 2005·Granted Apr 22, 2008·9 cites·6 claims
- 0462US8495054B2Logic diagram search deviceTSUDAKA SHINICHIRO·Filed 2012·Granted Jul 23, 2013·2 cites·8 claims
- 0557US8677367B2Execution order decision deviceTSUDAKA SHINICHIRO·Filed 2009·Granted Mar 18, 2014·2 cites·10 claims
- 0649US8059092B2User interface designing apparatusKONAKA HIROKI·Filed 2008·Granted Nov 15, 2011·1 cites·5 claims
- 0744US10347024B2Control logic diagram creation support apparatusMITSUBISHI ELECTRIC CORP·Filed 2016·Granted Jul 9, 2019·0 cites·3 claims
- 0844US2007213968A1User Interface Software Design SystemMITSUBISHI ELECTRIC CORP·Filed 2004·Application pending·0 cites
- 0940US8401813B2Test table creation system and test table creation methodTSUDAKA SHINICHIRO·Filed 2010·Granted Mar 19, 2013·0 cites·10 claims
- 1038US9529042B2Device for and method of estimating error point in logic diagramMITSUBISHI ELECTRIC CORP·Filed 2013·Granted Dec 27, 2016·0 cites·7 claims
- 1137US10090705B2Plant facilities testing apparatusMITSUBISHI ELECTRIC CORP·Filed 2013·Granted Oct 2, 2018·0 cites·17 claims
- 1235US9031672B2Logic diagram processing device and logic diagram processing methodYOSHINAGA MITSUNOBU·Filed 2013·Granted May 12, 2015·0 cites·7 claims
- 1329US2012136608A1Test table generating device and method of generating test tableYOSHINAGA MITSUNOBU·Filed 2011·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →