Inventor · disambiguated record
Shih-Hsing Wang
Also filed as: WANG SHIH-HSING
17 granted patents·4 pending applications·30 citations·filing 2002–2024
90Inventor score
Files withETRON TECHNOLOGY INC11UNIV NATIONAL CHIAO TUNG4WANG SHIH-HSING3INVENT AND COLLABORATION LABORATORY INC2CHANG MIN-CHIH1
Top patents by PatentIndex Score
21 records- 0180US10778204B1Comparator circuit with low power consumption and low kickback noiseUNIV NATIONAL CHIAO TUNG·Filed 2020·Granted Sep 15, 2020·2 cites·14 claims
- 0277US10277122B1Charge pump circuit and phase locked loop system using the sameUNIV NATIONAL CHIAO TUNG·Filed 2018·Granted Apr 30, 2019·3 cites·10 claims
- 0376US7359265B2Data flow scheme for low power DRAMETRON TECHNOLOGY INC·Filed 2006·Granted Apr 15, 2008·8 cites·4 claims
- 0460US2024395668A1Memory array circuitINVENT AND COLLABORATION LABORATORY INC·Filed 2024·Application pending·0 cites
- 0559US8773179B2Input receiver and operation method thereofETRON TECHNOLOGY INC·Filed 2013·Granted Jul 8, 2014·2 cites·29 claims
- 0655US8125838B2System in package integrated circuit with self-generating reference voltageWANG SHIH-HSING·Filed 2010·Granted Feb 28, 2012·2 cites·9 claims
- 0753US8345500B2Memory having a disabling circuit and method for disabling the memoryETRON TECHNOLOGY INC·Filed 2010·Granted Jan 1, 2013·1 cites·8 claims
- 0853US2025104763A1Dynamic random-access memory structure with high speed and wide busINVENT AND COLLABORATION LABORATORY INC·Filed 2024·Application pending·0 cites
- 0952US6943044B1Method of high speed data rate testingETRON TECHNOLOGY INC·Filed 2002·Granted Sep 13, 2005·7 cites·14 claims
- 1048US7978525B2Data flow scheme for low power DRAMETRON TECHNOLOGY INC·Filed 2008·Granted Jul 12, 2011·1 cites·4 claims
- 1148US7924641B2Data flow scheme for low power DRAMETRON TECHNOLOGY INC·Filed 2008·Granted Apr 12, 2011·1 cites·3 claims
- 1247US8201035B2Testing system and method thereofWANG SHIH-HSING·Filed 2009·Granted Jun 12, 2012·2 cites·16 claims
- 1338US10439621B1Two-step switching method for a circuit switchUNIV NATIONAL CHIAO TUNG·Filed 2018·Granted Oct 8, 2019·0 cites·9 claims
- 1438US8520453B2Device for generating a test pattern of a memory chip and method thereofWANG SHIH-HSING·Filed 2011·Granted Aug 27, 2013·1 cites·15 claims
- 1538US7983102B2Data detecting apparatus and methods thereofETRON TECHNOLOGY INC·Filed 2009·Granted Jul 19, 2011·0 cites·11 claims
- 1636US7663949B2Memory row architecture having memory row redundancy repair functionETRON TECHNOLOGY INC·Filed 2007·Granted Feb 16, 2010·0 cites·3 claims
- 1736US7475305B2Method of high speed data rate testingETRON TECHNOLOGY INC·Filed 2005·Granted Jan 6, 2009·0 cites·17 claims
- 1836US2021175880A1Comparator circuit with low supply noiseUNIV NATIONAL CHIAO TUNG·Filed 2020·Application pending·0 cites
- 1935US2008048727A1Sense amplifier-based latchETRON TECHNOLOGY INC·Filed 2007·Application pending·0 cites
- 2033US9093179B2Chip capable of improving test coverage of pads and related method thereofETRON TECHNOLOGY INC·Filed 2013·Granted Jul 28, 2015·0 cites·15 claims
- 2121US8773931B2Method of detecting connection defects of memory and memory capable of detecting connection defects thereofCHANG MIN-CHIH·Filed 2012·Granted Jul 8, 2014·0 cites·17 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →