Inventor · disambiguated record
Shigekazu Yamada
Also filed as: YAMADA SHIGEKAZU
92 granted patents·4 pending applications·969 citations·filing 1995–2022
99Inventor score
Files withMICRON TECHNOLOGY INC52YAMADA SHIGEKAZU12FUJITSU LTD11SPANSION LLC6ADVANCED MICRO DEVICES INC4
Top patents by PatentIndex Score
96 records- 0197US9064577B2Apparatuses and methods to control body potential in memory operationsMICRON TECHNOLOGY INC·Filed 2012·Granted Jun 23, 2015·22 cites·19 claims
- 0296US11354067B2Asymmetric plane driver circuits in a multi-plane memory deviceMICRON TECHNOLOGY INC·Filed 2020·Granted Jun 7, 2022·4 cites·20 claims
- 0396US10056149B2Semiconductor memory column decoder device and methodMICRON TECHNOLOGY INC·Filed 2016·Granted Aug 21, 2018·16 cites·19 claims
- 0496US9536618B2Apparatuses and methods to control body potential in memory operationsMICRON TECHNOLOGY INC·Filed 2015·Granted Jan 3, 2017·22 cites·20 claims
- 0596US7184338B2Semiconductor device, semiconductor device testing method, and programming methodSPANSION LLC·Filed 2005·Granted Feb 27, 2007·78 cites·33 claims
- 0695US8634264B2Apparatuses, integrated circuits, and methods for measuring leakage currentYAMADA SHIGEKAZU·Filed 2011·Granted Jan 21, 2014·18 cites·24 claims
- 0795US6594181B1System for reading a double-bit memory cellFUJITSU LTD·Filed 2002·Granted Jul 15, 2003·110 cites·17 claims
- 0894US11581043B2Memory device and method of operationMICRON TECHNOLOGY INC·Filed 2021·Granted Feb 14, 2023·2 cites·20 claims
- 0994US10446236B1Memory device and method of operationMICRON TECHNOLOGY INC·Filed 2018·Granted Oct 15, 2019·10 cites·20 claims
- 1094US6912160B2Nonvolatile semiconductor memory deviceFUJITSU LTD·Filed 2003·Granted Jun 28, 2005·96 cites·8 claims
- 1192US9443610B1Leakage current detectionMICRON TECHNOLOGY INC·Filed 2015·Granted Sep 13, 2016·19 cites·23 claims
- 1292US7483305B2Method, apparatus and system relating to automatic cell threshold voltage measurementMICRON TECHNOLOGY INC·Filed 2006·Granted Jan 27, 2009·30 cites·34 claims
- 1391US11127463B2Memory device and method of operationMICRON TECHNOLOGY INC·Filed 2021·Granted Sep 21, 2021·2 cites·20 claims
- 1491US8588007B2Leakage measurement systemsYAMADA SHIGEKAZU·Filed 2011·Granted Nov 19, 2013·12 cites·21 claims
- 1590US9881686B2Apparatuses and methods to control body potential in 3D non-volatile memory operationsMICRON TECHNOLOGY INC·Filed 2016·Granted Jan 30, 2018·6 cites·18 claims
- 1689US10586600B1High-voltage shifter with reduced transistor degradationMICRON TECHNOLOGY INC·Filed 2019·Granted Mar 10, 2020·6 cites·20 claims
- 1789US10510397B2Integrated circuit devices configured to control discharge of a control gate voltageMICRON TECHNOLOGY INC·Filed 2019·Granted Dec 17, 2019·6 cites·20 claims
- 1889US10510419B1Monitoring and charging inhibit bit-lineMICRON TECHNOLOGY INC·Filed 2018·Granted Dec 17, 2019·7 cites·20 claims
- 1985US10170196B2Apparatuses and methods to control body potential in 3D non-volatile memory operationsMICRON TECHNOLOGY INC·Filed 2017·Granted Jan 1, 2019·4 cites·19 claims
- 2085US6839279B2Nonvolatile semiconductor memory deviceFUJITSU LTD·Filed 2003·Granted Jan 4, 2005·38 cites·8 claims
- 2184US8873297B2Select gate programming in a memory deviceMICRON TECHNOLOGY INC·Filed 2013·Granted Oct 28, 2014·7 cites·25 claims
- 2284US8284613B2Semiconductor memory device having bit line pre-charge unit separated from data registerYAMADA SHIGEKAZU·Filed 2010·Granted Oct 9, 2012·8 cites·22 claims
- 2383US10937501B2Memory device and method of operationMICRON TECHNOLOGY INC·Filed 2019·Granted Mar 2, 2021·3 cites·20 claims
- 2483US10803957B2Monitoring and charging inhibit bit-lineMICRON TECHNOLOGY INC·Filed 2019·Granted Oct 13, 2020·4 cites·20 claims
- 2583US8542534B2Select gate programming in a memory deviceYAMADA SHIGEKAZU·Filed 2010·Granted Sep 24, 2013·7 cites·33 claims
- 2683US7227778B2Semiconductor device and writing methodSPANSION LLC·Filed 2005·Granted Jun 5, 2007·14 cites·16 claims
- 2783US7082066B2Flash memory having spare sector with shortened access timeSPANSION LLC·Filed 2005·Granted Jul 25, 2006·15 cites·7 claims
- 2882US11670374B2Memory device including initial charging phase for double sense operationMICRON TECHNOLOGY INC·Filed 2021·Granted Jun 6, 2023·1 cites·12 claims
- 2982US9424936B1Current leakage reduction in 3D NAND memoryINTEL CORP·Filed 2015·Granted Aug 23, 2016·6 cites·18 claims
- 3082US8947946B2Leakage measurement systemsMICRON TECHNOLOGY INC·Filed 2013·Granted Feb 3, 2015·5 cites·23 claims
- 3182US8462559B2Memory erase methods and devicesYAMADA SHIGEKAZU·Filed 2011·Granted Jun 11, 2013·6 cites·21 claims
- 3281US8000151B2Semiconductor memory column decoder device and methodMICRON TECHNOLOGY INC·Filed 2008·Granted Aug 16, 2011·8 cites·15 claims
- 3380US10741263B2Standby biasing techniques to reduce read disturbsMICRON TECHNOLOGY INC·Filed 2019·Granted Aug 11, 2020·3 cites·20 claims
- 3480US6621742B1System for programming a flash memory deviceFUJITSU LTD·Filed 2002·Granted Sep 16, 2003·27 cites·6 claims
- 3579US10347320B1Controlling discharge of a control gate voltageMICRON TECHNOLOGY INC·Filed 2018·Granted Jul 9, 2019·3 cites·20 claims
- 3679US8503249B2Semiconductor memory column decoder device and methodYAMADA SHIGEKAZU·Filed 2011·Granted Aug 6, 2013·4 cites·23 claims
- 3779US6438041B1Negative voltage regulationADVANCED MICRO DEVICES INC·Filed 2000·Granted Aug 20, 2002·27 cites·24 claims
- 3878US10998050B2High-voltage shifter with reduced transistor degradationMICRON TECHNOLOGY INC·Filed 2020·Granted May 4, 2021·1 cites·20 claims
- 3978US10490292B2Apparatuses and methods to control body potential in 3D non-volatile memory operationsMICRON TECHNOLOGY INC·Filed 2018·Granted Nov 26, 2019·2 cites·18 claims
- 4077US6542409B2System for reference current tracking in a semiconductor deviceFUJITSU LTD·Filed 2001·Granted Apr 1, 2003·24 cites·15 claims
- 4177US6147906AMethod and system for saving overhead program time in a memory deviceADVANCED MICRO DEVICES INC·Filed 1999·Granted Nov 14, 2000·38 cites·25 claims
- 4275US9159452B2Automatic word line leakage measurement circuitryYAMADA SHIGEKAZU·Filed 2008·Granted Oct 13, 2015·8 cites·14 claims
- 4374US8760933B2Circuits, systems, and methods for driving high and low voltages on bit lines in non-volatile memoryYAMADA SHIGEKAZU·Filed 2012·Granted Jun 24, 2014·3 cites·25 claims
- 4474US8482986B2Word line drivers in non-volatile memory device and method having a shared power bank and processor-based systems using sameYAMADA SHIGEKAZU·Filed 2012·Granted Jul 9, 2013·3 cites·20 claims
- 4574US7916518B2VCC control inside data register of memory deviceINTEL CORP·Filed 2010·Granted Mar 29, 2011·4 cites·20 claims
- 4674US5615154AFlash memory device having erase verificationFUJITSU LTD·Filed 1995·Granted Mar 25, 1997·36 cites·15 claims
- 4773US6400638B1Wordline driver for flash memory read modeADVANCED MICRO DEVICES INC·Filed 2000·Granted Jun 4, 2002·20 cites·17 claims
- 4872US8045395B2Circuits, systems and methods for driving high and low voltages on bit lines in non-volatile memoryMICRON TECHNOLOGY INC·Filed 2010·Granted Oct 25, 2011·3 cites·23 claims
- 4972US6781884B2System for setting memory voltage thresholdFUJITSU LTD·Filed 2002·Granted Aug 24, 2004·19 cites·8 claims
- 5072US6208564B1High voltage comparatorFUJITSU LTD·Filed 1999·Granted Mar 27, 2001·31 cites·16 claims
Showing the top 50 of 96 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →