Inventor · disambiguated record
Shintaro Yoshii
Also filed as: YOSHII SHINTARO
3 granted patents·124 citations·filing 1988–1989
73Inventor score
Files withTOSHIBA KK3
Top patents by PatentIndex Score
3 records- 0191US4990459AImpurity measuring methodTOSHIBA KK·Filed 1989·Granted Feb 5, 1991·80 cites·6 claims
- 0271US4980300AGettering method for a semiconductor waferTOSHIBA KK·Filed 1988·Granted Dec 25, 1990·42 cites·22 claims
- 0327US4837610AInsulation film for a semiconductor deviceTOSHIBA KK·Filed 1988·Granted Jun 6, 1989·2 cites·2 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →