Inventor · disambiguated record
Sheng-Wen Yu
Also filed as: Yu sheng-wen
11 granted patents·23 citations·filing 2012–2020
86Inventor score
Top patents by PatentIndex Score
11 records- 0191US9722083B2Source/drain junction formationTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2013·Granted Aug 1, 2017·9 cites·20 claims
- 0284US10720529B2Source/drain junction formationTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted Jul 21, 2020·2 cites·20 claims
- 0381US8753904B2Method and system for semiconductor device pattern loading effect characterizationTSAI CHUN HSIUNG·Filed 2012·Granted Jun 17, 2014·4 cites·20 claims
- 0474US8883522B2System for semiconductor device characterization using reflectivity measurementTAIWAN SEMICONDUCTOR MFG·Filed 2014·Granted Nov 11, 2014·2 cites·20 claims
- 0572US11387363B2Source/drain junction formationTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Jul 12, 2022·0 cites·20 claims
- 0672US9482518B2Systems and methods for semiconductor device process determination using reflectivity measurementTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2014·Granted Nov 1, 2016·2 cites·20 claims
- 0772US8927359B2Multi-composition dielectric for semiconductor deviceTAIWAN SEMICONDUCTOR MFG·Filed 2013·Granted Jan 6, 2015·3 cites·20 claims
- 0862US9257323B2Semiconductor device and method for forming the sameTAIWAN SEMICONDUCTOR MFG·Filed 2013·Granted Feb 9, 2016·1 cites·19 claims
- 0960US10158019B2Source/drain junction formationTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2017·Granted Dec 18, 2018·0 cites·20 claims
- 1051US9953878B2Method of forming a semiconductor deviceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2016·Granted Apr 24, 2018·0 cites·20 claims
- 1142US10134896B2Cyclic deposition etch chemical vapor deposition epitaxy to reduce EPI abnormalityTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2013·Granted Nov 20, 2018·0 cites·14 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →