Inventor · disambiguated record
Sih-Ying Chang
Also filed as: CHANG SIH-YING
2 granted patents·1 pending application·0 citations·filing 2019–2023
23Inventor score
Technology areasG01R
Files withHERMES TESTING SOLUTIONS INC3
Top patents by PatentIndex Score
3 records- 0156US11703524B2Probing system for discrete waferHERMES TESTING SOLUTIONS INC·Filed 2021·Granted Jul 18, 2023·0 cites·3 claims
- 0248US12422475B2Adjustable supporting deviceHERMES TESTING SOLUTIONS INC·Filed 2023·Granted Sep 23, 2025·0 cites·11 claims
- 0331US2021055340A1Probe cardHERMES TESTING SOLUTIONS INC·Filed 2019·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →