Inventor · disambiguated record
Simon Diemer
Also filed as: DIEMER SIMON
6 granted patents·2 pending applications·14 citations·filing 2011–2022
74Inventor score
Top patents by PatentIndex Score
8 records- 0180US9437394B1Method of operating a charged particle microscope and charged particle microscope operating according to such methodZEISS CARL MICROSCOPY GMBH·Filed 2014·Granted Sep 6, 2016·7 cites·29 claims
- 0272US8487252B2Particle beam microscope and method for operating the particle beam microscopeDIEMER SIMON·Filed 2011·Granted Jul 16, 2013·5 cites·26 claims
- 0371US9916964B1Method of operating a charged particle microscope and charged particle microscope operating according to such methodZEISS CARL MICROSCOPY GMBH·Filed 2016·Granted Mar 13, 2018·2 cites·26 claims
- 0456US11915907B2Method for operating a particle beam microscopeZEISS CARL MICROSCOPY GMBH·Filed 2022·Granted Feb 27, 2024·0 cites·20 claims
- 0553US11328896B2Device and method for tracking microscopic samplesZEISS CARL MICROSCOPY GMBH·Filed 2019·Granted May 10, 2022·0 cites·22 claims
- 0649US2023078510A1Method for focusing and operating a particle beam microscopeZEISS CARL MICROSCOPY GMBH·Filed 2022·Application pending·0 cites
- 0741US9455115B2Method of adjusting a stigmator in a particle beam apparatus and a Particle beam systemZEISS CARL MICROSCOPY GMBH·Filed 2014·Granted Sep 27, 2016·0 cites·19 claims
- 0835US2020311886A1Method for determining an image recording aberrationZEISS CARL MICROSCOPY GMBH·Filed 2020·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →