Inventor · disambiguated record
Si-Yeol Lee
Also filed as: LEE SI-YEOL
15 granted patents·783 citations·filing 1994–2000
95Inventor score
Files withSAMSUNG ELECTRONICS CO LTD15
Top patents by PatentIndex Score
15 records- 0196US5771199AIntegrated circuit memory devices having improved dual memory bank control capability and methods of operating sameSAMSUNG ELECTRONICS CO LTD·Filed 1996·Granted Jun 23, 1998·182 cites·18 claims
- 0294US5631871ASystem for selecting one of a plurality of memory banks for use in an active cycle and all other banks for an inactive precharge cycleSAMSUNG ELECTRONICS CO LTD·Filed 1995·Granted May 20, 1997·84 cites·1 claims
- 0394US5590086ASemiconductor memory having a plurality of I/O busesSAMSUNG ELECTRONICS CO LTD·Filed 1995·Granted Dec 31, 1996·92 cites·1 claims
- 0493US5835956ASynchronous dram having a plurality of latency modesSAMSUNG ELECTRONICS CO LTD·Filed 1997·Granted Nov 10, 1998·76 cites·33 claims
- 0592US5838990ACircuit in a semiconductor memory for programming operation modes of the memorySAMSUNG ELECTRONICS CO LTD·Filed 1997·Granted Nov 17, 1998·63 cites·47 claims
- 0692US5568445ASynchronous semiconductor memory device with a write latency control functionSAMSUNG ELECTRONICS CO LTD·Filed 1995·Granted Oct 22, 1996·101 cites·17 claims
- 0788US5703828ASemiconductor memorySAMSUNG ELECTRONICS CO LTD·Filed 1995·Granted Dec 30, 1997·52 cites·14 claims
- 0886US6343036B1Multi-bank dynamic random access memory devices having all bank precharge capabilitySAMSUNG ELECTRONICS CO LTD·Filed 1998·Granted Jan 29, 2002·41 cites·15 claims
- 0969US5485426ASemiconductor memory device having a structure for driving input/output lines at a high speedSAMSUNG ELECTRONICS CO LTD·Filed 1994·Granted Jan 16, 1996·27 cites·9 claims
- 1062US5896395AIntegrated circuit memory devices and operating methods including temporary data path width overrideSAMSUNG ELECTRONICS CO LTD·Filed 1996·Granted Apr 20, 1999·22 cites·18 claims
- 1159US6151272AIntegrated circuit memory devices that utilize data masking techniques to facilitate test mode analysisSAMSUNG ELECTRONICS CO LTD·Filed 1999·Granted Nov 21, 2000·15 cites·10 claims
- 1253US5559844ABinary counter with sped-up ripple carrySAMSUNG ELECTRONICS CO LTD·Filed 1994·Granted Sep 24, 1996·11 cites·50 claims
- 1343US6272068B1Integrated circuit memory devices that utilize data masking techniques to facilitate test mode analysisSAMSUNG ELECTRONICS CO LTD·Filed 2000·Granted Aug 7, 2001·3 cites·14 claims
- 1441US6232797B1Integrated circuit devices having data buffer control circuitry therein that accounts for clock irregularitiesSAMSUNG ELECTRONICS CO LTD·Filed 1999·Granted May 15, 2001·7 cites·11 claims
- 1541US6154416AColumn address decoder for two bit prefetch of semiconductor memory device and decoding method thereofSAMSUNG ELECTRONICS CO LTD·Filed 1999·Granted Nov 28, 2000·7 cites·22 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →