Inventor · disambiguated record
Simon Mieth
Also filed as: MIETH SIMON
2 granted patents·3 pending applications·2 citations·filing 2019–2025
42Inventor score
Files withPRECITEC OPTRONIK GMBH5
Top patents by PatentIndex Score
5 records- 0183US12264914B2Device and method for measuring wafersPRECITEC OPTRONIK GMBH·Filed 2024·Granted Apr 1, 2025·1 cites·14 claims
- 0265US2025198743A1Device and method for measuring wafersPRECITEC OPTRONIK GMBH·Filed 2025·Application pending·0 cites
- 0363US2025189299A1Device and Method for Measuring WafersPRECITEC OPTRONIK GMBH·Filed 2023·Application pending·0 cites
- 0457US10571249B1Optical measuring device and methodPRECITEC OPTRONIK GMBH·Filed 2019·Granted Feb 25, 2020·1 cites·9 claims
- 0553US2024393261A1Apparatus and method for measuring wafersPRECITEC OPTRONIK GMBH·Filed 2024·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →