Inventor · disambiguated record
Sivagnanam Parthasarathy
Also filed as: PARTHASARATHY SIVAGNANAM
230 granted patents·46 pending applications·860 citations·filing 1991–2025
99Inventor score
Files withMICRON TECHNOLOGY INC253ST MICROELECTRONICS INC10PARTHASARATHY SIVAGNANAM5EDGESTREAM INC1GARANI SHAYAN SRINIVASA1
Top patents by PatentIndex Score
276 records- 0198US11562793B2Read soft bits through boosted modulation following reading hard bitsMICRON TECHNOLOGY INC·Filed 2020·Granted Jan 24, 2023·8 cites·18 claims
- 0298US11474748B2Compound feature generation in classification of error rate of data retrieved from memory cellsMICRON TECHNOLOGY INC·Filed 2021·Granted Oct 18, 2022·12 cites·20 claims
- 0398US11410734B1Voltage bin selection for blocks of a memory device after power up of the memory deviceMICRON TECHNOLOGY INC·Filed 2021·Granted Aug 9, 2022·8 cites·20 claims
- 0498US11403042B2Self adapting iterative read calibration to retrieve data from memory cellsMICRON TECHNOLOGY INC·Filed 2021·Granted Aug 2, 2022·9 cites·20 claims
- 0598US11349498B2Bit flipping low-density parity-check decoders with low error floorMICRON TECHNOLOGY INC·Filed 2020·Granted May 31, 2022·8 cites·20 claims
- 0698US11257546B2Reading of soft bits and hard bits from memory cellsMICRON TECHNOLOGY INC·Filed 2020·Granted Feb 22, 2022·11 cites·20 claims
- 0798US11221800B2Adaptive and/or iterative operations in executing a read command to retrieve data from memory cellsMICRON TECHNOLOGY INC·Filed 2020·Granted Jan 11, 2022·11 cites·17 claims
- 0898US11200959B1Optimization of soft bit windows based on signal and noise characteristics of memory cellsMICRON TECHNOLOGY INC·Filed 2020·Granted Dec 14, 2021·7 cites·20 claims
- 0998US11086572B1Self adapting iterative read calibration to retrieve data from memory cellsMICRON TECHNOLOGY INC·Filed 2020·Granted Aug 10, 2021·20 cites·16 claims
- 1098US11081200B1Intelligent proactive responses to operations to read data from memory cellsMICRON TECHNOLOGY INC·Filed 2020·Granted Aug 3, 2021·18 cites·20 claims
- 1198US11049582B1Detection of an incorrectly located read voltageMICRON TECHNOLOGY INC·Filed 2020·Granted Jun 29, 2021·16 cites·20 claims
- 1298US11029890B1Compound feature generation in classification of error rate of data retrieved from memory cellsMICRON TECHNOLOGY INC·Filed 2020·Granted Jun 8, 2021·25 cites·20 claims
- 1398US11024401B1Compute an optimized read voltageMICRON TECHNOLOGY INC·Filed 2020·Granted Jun 1, 2021·15 cites·20 claims
- 1497US11676664B2Voltage bin selection for blocks of a memory device after power up of the memory deviceMICRON TECHNOLOGY INC·Filed 2022·Granted Jun 13, 2023·4 cites·20 claims
- 1597US11437108B1Voltage bin calibration based on a temporary voltage shift offsetMICRON TECHNOLOGY INC·Filed 2021·Granted Sep 6, 2022·5 cites·20 claims
- 1697US11394403B1Error correction based on rate adaptive low density parity check (LDPC) codes with flexible column weights in the parity check matricesMICRON TECHNOLOGY INC·Filed 2021·Granted Jul 19, 2022·7 cites·18 claims
- 1797US11355203B2Determine optimized read voltage via identification of distribution shape of signal and noise characteristicsMICRON TECHNOLOGY INC·Filed 2020·Granted Jun 7, 2022·6 cites·16 claims
- 1897US11238953B2Determine bit error count based on signal and noise characteristics centered at an optimized read voltageMICRON TECHNOLOGY INC·Filed 2020·Granted Feb 1, 2022·6 cites·20 claims
- 1997US11132037B2Operating temperature management of a memory sub-systemMICRON TECHNOLOGY INC·Filed 2018·Granted Sep 28, 2021·11 cites·20 claims
- 2096US11726719B2Compound feature generation in classification of error rate of data retrieved from memory cellsMICRON TECHNOLOGY INC·Filed 2022·Granted Aug 15, 2023·3 cites·20 claims
- 2196US11709734B2Error correction with syndrome computation in a memory deviceMICRON TECHNOLOGY INC·Filed 2021·Granted Jul 25, 2023·5 cites·20 claims
- 2296US11657886B2Intelligent proactive responses to operations to read data from memory cellsMICRON TECHNOLOGY INC·Filed 2021·Granted May 23, 2023·4 cites·20 claims
- 2396US11593005B2Managing voltage bin selection for blocks of a memory deviceMICRON TECHNOLOGY INC·Filed 2021·Granted Feb 28, 2023·4 cites·20 claims
- 2496US11227666B1Track charge loss based on signal and noise characteristics of memory cells collected in calibration operationsMICRON TECHNOLOGY INC·Filed 2020·Granted Jan 18, 2022·4 cites·20 claims
- 2596US11205495B1Read disturb mitigation based on signal and noise characteristics of memory cells collected for read calibrationMICRON TECHNOLOGY INC·Filed 2020·Granted Dec 21, 2021·4 cites·20 claims
- 2695US11775217B2Adaptive and/or iterative operations in executing a read command to retrieve data from memory cellsMICRON TECHNOLOGY INC·Filed 2021·Granted Oct 3, 2023·3 cites·20 claims
- 2795US11762599B2Self adapting iterative read calibration to retrieve data from memory cellsMICRON TECHNOLOGY INC·Filed 2022·Granted Sep 19, 2023·3 cites·20 claims
- 2895US11709727B2Managing error-handling flows in memory devicesMICRON TECHNOLOGY INC·Filed 2021·Granted Jul 25, 2023·3 cites·19 claims
- 2995US11670396B2Determine bit error count based on signal and noise characteristics centered at an optimized read voltageMICRON TECHNOLOGY INC·Filed 2021·Granted Jun 6, 2023·3 cites·20 claims
- 3095US11662905B2Memory system performance enhancements using measured signal and noise characteristics of memory cellsMICRON TECHNOLOGY INC·Filed 2021·Granted May 30, 2023·3 cites·20 claims
- 3195US11177013B1Determine signal and noise characteristics centered at an optimized read voltageMICRON TECHNOLOGY INC·Filed 2020·Granted Nov 16, 2021·4 cites·20 claims
- 3295US11146291B2Configuring iterative error correction parameters using criteria from previous iterationsMICRON TECHNOLOGY INC·Filed 2020·Granted Oct 12, 2021·7 cites·20 claims
- 3395US11133083B1Read model of memory cells using information generated during read operationsMICRON TECHNOLOGY INC·Filed 2020·Granted Sep 28, 2021·4 cites·20 claims
- 3494US12046298B2Managing compensation for charge coupling and lateral migration in memory devicesMICRON TECHNOLOGY INC·Filed 2022·Granted Jul 23, 2024·2 cites·20 claims
- 3594US11934266B2Memory compaction management in memory devicesMICRON TECHNOLOGY INC·Filed 2022·Granted Mar 19, 2024·2 cites·19 claims
- 3694US11923867B1Iterative decoder with a dynamic maximum stop conditionMICRON TECHNOLOGY INC·Filed 2022·Granted Mar 5, 2024·3 cites·20 claims
- 3794US11829245B2Multi-layer code rate architecture for copyback between partitions with different code ratesMICRON TECHNOLOGY INC·Filed 2022·Granted Nov 28, 2023·3 cites·33 claims
- 3894US11276473B2Coarse calibration based on signal and noise characteristics of memory cells collected in prior calibration operationsMICRON TECHNOLOGY INC·Filed 2020·Granted Mar 15, 2022·3 cites·20 claims
- 3994US11237726B2Memory system performance enhancements using measured signal and noise characteristics of memory cellsMICRON TECHNOLOGY INC·Filed 2019·Granted Feb 1, 2022·12 cites·20 claims
- 4093US11983067B2Adjustment of code rate as function of memory endurance state metricMICRON TECHNOLOGY INC·Filed 2022·Granted May 14, 2024·2 cites·20 claims
- 4193US11398835B1Managing defective bitline locations in a bit flipping decoderMICRON TECHNOLOGY INC·Filed 2021·Granted Jul 26, 2022·3 cites·20 claims
- 4293US11152073B1Iterative read calibration enhanced according to patterns of shifts in read voltagesMICRON TECHNOLOGY INC·Filed 2020·Granted Oct 19, 2021·3 cites·20 claims
- 4393US10318378B2Redundant array of independent NAND for a three-dimensional memory arrayMICRON TECHNOLOGY INC·Filed 2016·Granted Jun 11, 2019·9 cites·23 claims
- 4492US11689217B2Methods and systems of stall mitigation in iterative decodersMICRON TECHNOLOGY INC·Filed 2021·Granted Jun 27, 2023·3 cites·20 claims
- 4592US11663079B2Data recovery using a combination of error correction schemesMICRON TECHNOLOGY INC·Filed 2021·Granted May 30, 2023·3 cites·20 claims
- 4692US11587638B2Read model of memory cells using information generated during read operationsMICRON TECHNOLOGY INC·Filed 2021·Granted Feb 21, 2023·2 cites·20 claims
- 4792US6754807B1System and method for managing vertical dependencies in a digital signal processorST MICROELECTRONICS INC·Filed 2000·Granted Jun 22, 2004·120 cites·24 claims
- 4891US11740970B2Dynamic adjustment of data integrity operations of a memory system based on error rate classificationMICRON TECHNOLOGY INC·Filed 2020·Granted Aug 29, 2023·3 cites·25 claims
- 4990US12009040B2Detection of an incorrectly located read voltageMICRON TECHNOLOGY INC·Filed 2022·Granted Jun 11, 2024·1 cites·20 claims
- 5090US11587639B2Voltage calibration scans to reduce memory device overheadMICRON TECHNOLOGY INC·Filed 2021·Granted Feb 21, 2023·2 cites·20 claims
Showing the top 50 of 276 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →