Inventor · disambiguated record

Sik-Han Soh

Also filed as: SOH SIK-HAN

1 granted patent·52 citations·filing 1998–1998

49Inventor score

Technology areasG01R

Files withFAIRCHILD SEMICONDUCTOR1

Top patents by PatentIndex Score

1 record

0176US6060895AWafer level dielectric test structure and related method for accelerated endurance testingFAIRCHILD SEMICONDUCTOR·Filed 1998·Granted May 9, 2000·52 cites·22 claims

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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →