Inventor · disambiguated record
Sibina Sukman
Also filed as: SUKMAN SIBINA
2 granted patents·9 citations·filing 2003–2003
54Inventor score
Files withINFINEON TECHNOLOGIES AG2
Top patents by PatentIndex Score
2 records- 0148US6917208B2Method and test structure for determining resistances at a plurality of interconnected resistors in an integrated circuitINFINEON TECHNOLOGIES AG·Filed 2003·Granted Jul 12, 2005·6 cites·4 claims
- 0247US6856562B2Test structure for measuring a junction resistance in a DRAM memory cell arrayINFINEON TECHNOLOGIES AG·Filed 2003·Granted Feb 15, 2005·3 cites·6 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →