Inventor · disambiguated record
Sipke Wadman
Also filed as: WADMAN SIPKE · WADMAN SIPKE SIKKE
21 granted patents·1 pending application·347 citations·filing 1974–2009
95Inventor score
Files withKONINKL PHILIPS ELECTRONICS NV10PHILIPS CORP6WADMAN SIPKE4UZENBAJAKAVA NATALLIA EDUARDAUNA1WADMAN SIPKE SIKKE1
Top patents by PatentIndex Score
22 records- 0190US7649628B2Optical inspection of test surfacesKONINKL PHILIPS ELECTRONICS NV·Filed 2005·Granted Jan 19, 2010·17 cites·15 claims
- 0287US5460451APyrometer including an emissivity meterPHILIPS CORP·Filed 1993·Granted Oct 24, 1995·80 cites·11 claims
- 0385US7872754B2Optical measurement deviceKONINKL PHILIPS ELECTRONICS NV·Filed 2007·Granted Jan 18, 2011·10 cites·20 claims
- 0485US6025037AMethod of curing a filmPHILIPS CORP·Filed 1995·Granted Feb 15, 2000·51 cites·11 claims
- 0580US7554665B2Dual beam set-up for parousiameterKONINKL PHILIPS ELECTRONICS NV·Filed 2006·Granted Jun 30, 2009·7 cites·11 claims
- 0678US6617541B1Laser etching methodKONINKL PHILIPS ELECTRONICS NV·Filed 1995·Granted Sep 9, 2003·43 cites·13 claims
- 0776US6577397B1ScatterometerKONINKL PHILIPS ELECTRONICS NV·Filed 1999·Granted Jun 10, 2003·39 cites·7 claims
- 0875US7978332B2Optical measurement deviceKONINKL PHILIPS ELECTRONICS NV·Filed 2007·Granted Jul 12, 2011·4 cites·21 claims
- 0971US8077319B2Apparatus and a method for observing the surface of a sampleWADMAN SIPKE·Filed 2007·Granted Dec 13, 2011·3 cites·10 claims
- 1069US5406042ADevice for and method of providing marks on an object by means of electromagnetic radiationPHILIPS CORP·Filed 1990·Granted Apr 11, 1995·29 cites·28 claims
- 1167US8610767B2Apparatus for skin imaging, system for skin analysisUZENBAJAKAVA NATALLIA EDUARDAUNA·Filed 2009·Granted Dec 17, 2013·15 cites·17 claims
- 1262US3981666ACompression deviceWADMAN SIPKE SIKKE·Filed 1974·Granted Sep 21, 1976·17 cites·6 claims
- 1360US8462356B2Apparatus and method for observing the surface of a sampleWADMAN SIPKE·Filed 2008·Granted Jun 11, 2013·2 cites·12 claims
- 1449US8269983B2Apparatus for observing the surface of a sampleWADMAN SIPKE·Filed 2008·Granted Sep 18, 2012·0 cites·5 claims
- 1549US7349096B2Scatterometer and a method for observing a surfaceKONINKL PHILIPS ELECTRONICS NV·Filed 2004·Granted Mar 25, 2008·4 cites·8 claims
- 1648US2011096150A1Method and apparatus for the optical characterization of surfacesKONINKL PHILIPS ELECTRONICS NV·Filed 2008·Application pending·0 cites
- 1746US4684251ASpectrometerPHILIPS CORP·Filed 1986·Granted Aug 4, 1987·11 cites·6 claims
- 1841US4726047AX-ray analysis apparatusPHILIPS CORP·Filed 1984·Granted Feb 16, 1988·8 cites·12 claims
- 1939US8422007B2Optical measurement device with reduced contact areaWADMAN SIPKE·Filed 2006·Granted Apr 16, 2013·0 cites·18 claims
- 2039US7248368B2Scatterometer and a method for inspecting a surfaceKONINKL PHILIPS ELECTRONICS NV·Filed 2004·Granted Jul 24, 2007·0 cites·7 claims
- 2135US5993894AMethod of manufacturing a conductive layer on a substratePHILIPS CORP·Filed 1998·Granted Nov 30, 1999·4 cites·12 claims
- 2232US6451387B1Method of applying a ceramic layer to an under-layer having relatively low melting temperatureKONINKL PHILIPS ELECTRONICS NV·Filed 1999·Granted Sep 17, 2002·3 cites·8 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →