Inventor · disambiguated record
Soo-In Cho
Also filed as: CHO SOO I · CHO SOO-IN
27 granted patents·1 pending application·739 citations·filing 1988–2015
97Inventor score
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28 records- 0195US8958026B2Display apparatus having particular controllable shape deforming/maintaining unitSAMSUNG DISPLAY CO LTD·Filed 2013·Granted Feb 17, 2015·31 cites·30 claims
- 0290US5343438ASemiconductor memory device having a plurality of row address strobe signalsSAMSUNG ELECTRONICS CO LTD·Filed 1993·Granted Aug 30, 1994·78 cites·6 claims
- 0389US5933379AMethod and circuit for testing a semiconductor memory device operating at high frequencySAMSUNG ELECTRONICS CO LTD·Filed 1998·Granted Aug 3, 1999·79 cites·8 claims
- 0489US5748543ASelf repairing integrated circuit memory devices and methodsSAMSUNG ELECTRONICS CO LTD·Filed 1996·Granted May 5, 1998·79 cites·31 claims
- 0586US5153459AData transmission circuit for data buses including feedback circuitrySAMSUNG ELECTRONICS CO LTD·Filed 1988·Granted Oct 6, 1992·52 cites·28 claims
- 0684US5446697ASemiconductor memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 1993·Granted Aug 29, 1995·52 cites·21 claims
- 0781US5889719ASemiconductor memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 1995·Granted Mar 30, 1999·37 cites·6 claims
- 0877US5659519ABoosting voltage generator of semiconductor memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 1996·Granted Aug 19, 1997·40 cites·9 claims
- 0977US5097441AInterdigitated and twisted word line structure for semiconductor memoriesSAMSUNG ELECTRONICS CO LTD·Filed 1990·Granted Mar 17, 1992·62 cites·8 claims
- 1075US4920280ABack bias generatorSAMSUNG ELECTRONICS CO LTD·Filed 1988·Granted Apr 24, 1990·32 cites·20 claims
- 1174US9865059B2Medical image processing method and apparatus for determining plane of interestSAMSUNG ELECTRONICS CO LTD·Filed 2015·Granted Jan 9, 2018·2 cites·23 claims
- 1272US5130580ASense amplifier driving circuit employing current mirror for semiconductor memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 1990·Granted Jul 14, 1992·34 cites·17 claims
- 1371US6075384ACurrent-mode bidirectional input/output bufferSAMSUNG ELECTRONICS CO LTD·Filed 1998·Granted Jun 13, 2000·25 cites·19 claims
- 1465US6266286B1Wafer burn-in test circuit and method for testing a semiconductor memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 1999·Granted Jul 24, 2001·20 cites·10 claims
- 1562US6026038AWafer burn-in test circuit and method for testing a semiconductor memorySAMSUNG ELECTRONICS CO LTD·Filed 1997·Granted Feb 15, 2000·18 cites·13 claims
- 1657US5726939ASemiconductor memory device having fast writing circuit for test thereofSAMSUNG ELECTRONICS CO LTD·Filed 1996·Granted Mar 10, 1998·17 cites·11 claims
- 1756US5610869ASemiconductor memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 1995·Granted Mar 11, 1997·17 cites·8 claims
- 1853US5790465AWafer burn-in test circuit and a method thereofSAMSUNG ELECTRONICS CO LTD·Filed 1996·Granted Aug 4, 1998·15 cites·5 claims
- 1953US5140553AFlash writing circuit for writing test data in dynamic random access memory (dram) devicesSAMSUNG ELECTRONICS CO LTD·Filed 1990·Granted Aug 18, 1992·16 cites·7 claims
- 2048US6983010B1High frequency equalizer using a demultiplexing technique and related semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2000·Granted Jan 3, 2006·4 cites·20 claims
- 2147US5946242AInternal source voltage generator for a semiconductor memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 1997·Granted Aug 31, 1999·10 cites·18 claims
- 2240US11083434B2Ultrasonic imaging apparatus and control method thereofSAMSUNG MEDISON CO LTD·Filed 2015·Granted Aug 10, 2021·0 cites·18 claims
- 2339US6094376AData output buffer control circuit for a semiconductor memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 1997·Granted Jul 25, 2000·7 cites·13 claims
- 2437US5629894AMemory module having read-modify-write functionSAMSUNG ELECTRONICS CO LTD·Filed 1995·Granted May 13, 1997·5 cites·8 claims
- 2535US7483320B2Data input/output method of semiconductor memory device and semiconductor memory device for the sameSAMSUNG ELECTRONICS CO LTD·Filed 2005·Granted Jan 27, 2009·0 cites·12 claims
- 2635US5214600ASemiconductor memory array having interdigitated bit-line structureSAMSUNG ELECTRONICS CO LTD·Filed 1992·Granted May 25, 1993·5 cites·13 claims
- 2730US4959814ASensing detection circuit in dynamic random access memorySAMSUNG ELECTRONICS CO LTD·Filed 1988·Granted Sep 25, 1990·2 cites·4 claims
- 2828US2005114064A1Circuit for a parallel bit test of a semiconductor memory device and method thereofFiled 2004·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →