Inventor · disambiguated record
Soon-Keun Jeon
Also filed as: JEON SOON-KEUN
3 granted patents·1 pending application·32 citations·filing 1999–2008
69Inventor score
Technology areasG11C
Files withSAMSUNG ELECTRONICS CO LTD4
Top patents by PatentIndex Score
4 records- 0151US6247153B1Method and apparatus for testing semiconductor memory device having a plurality of memory banksSAMSUNG ELECTRONICS CO LTD·Filed 1999·Granted Jun 12, 2001·17 cites·15 claims
- 0250US7134059B2Pad connection structure of embedded memory devices and related memory testing methodSAMSUNG ELECTRONICS CO LTD·Filed 2002·Granted Nov 7, 2006·9 cites·9 claims
- 0342US7240257B2Memory test circuit and test systemSAMSUNG ELECTRONICS CO LTD·Filed 2004·Granted Jul 3, 2007·6 cites·26 claims
- 0433US2008175079A1Test scheme for fuse circuitSAMSUNG ELECTRONICS CO LTD·Filed 2008·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →