Inventor · disambiguated record
Souk Kim
Also filed as: KIM SOUK
12 granted patents·9 pending applications·5 citations·filing 2013–2025
81Inventor score
Top patents by PatentIndex Score
21 records- 0175US2024385220A1Test apparatus and test method thereofRYU SUNGYOON·Filed 2024·Application pending·0 cites
- 0275US2025341540A1Method of inspecting tip of atomic force microscope and method of manufacturing semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2025·Application pending·0 cites
- 0373US10373796B2Method of inspecting wafer using electron beamSAMSUNG ELECTRONICS CO LTD·Filed 2016·Granted Aug 6, 2019·2 cites·20 claims
- 0470US9583402B2Method of manufacturing a semiconductor device using semiconductor measurement systemSAMSUNG ELECTRONICS CO LTD·Filed 2015·Granted Feb 28, 2017·2 cites·19 claims
- 0569US12385946B2Method of inspecting tip of atomic force microscope and method of manufacturing semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted Aug 12, 2025·0 cites·8 claims
- 0668US12092656B2Test apparatus and test method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted Sep 17, 2024·0 cites·20 claims
- 0768US11004712B2Method of inspecting semiconductor wafer, inspection system for performing the same, and method of fabricating semiconductor device using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2019·Granted May 11, 2021·1 cites·20 claims
- 0865US2025224326A1Spectroscopic ellipsometer and substrate analysis method using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 0963US12110938B2Vibration isolation table for semiconductor equipment and vibration isolation table system including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted Oct 8, 2024·0 cites·19 claims
- 1063US2025198941A1Defect inspection system and defect inspection methodSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 1162US2025147096A1Substrate inspection apparatus and method of inspecting a substrate using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 1260US2025123243A1Semiconductor substrate inspection deviceSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 1355US2024332093A1Critical dimension prediction system and operation method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 1453US2024248051A1Wafer measurement apparatus and operating method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2023·Application pending·0 cites
- 1552US12362138B2Method of operating scanning electron microscope (SEM) and method of manufacturing semiconductor device using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted Jul 15, 2025·0 cites·20 claims
- 1648US11181831B2Methods of manufacturing semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2019·Granted Nov 23, 2021·0 cites·20 claims
- 1745US11017525B2Semiconductor pattern detecting apparatusSAMSUNG ELECTRONICS CO LTD·Filed 2019·Granted May 25, 2021·0 cites·20 claims
- 1845US9417055B2Apparatus for measuring thickness of thin film, system including the apparatus, and method for measuring thickness of thin filmSAMSUNG ELECTRONICS CO LTD·Filed 2015·Granted Aug 16, 2016·0 cites·20 claims
- 1945US2020182783A1Measuring apparatus and substrate analysis method using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2019·Application pending·0 cites
- 2040US10410937B2Optical measuring method for semiconductor wafer including a plurality of patterns and method of manufacturing semiconductor device using optical measurementSAMSUNG ELECTRONICS CO LTD·Filed 2018·Granted Sep 10, 2019·0 cites·20 claims
- 2133US9148549B2Image processing method and image processing apparatus using time axis low band pass filterSNU PRECISION CO LTD·Filed 2013·Granted Sep 29, 2015·0 cites·5 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →