Inventor · disambiguated record
Sravan Kumar Bhaskarani
Also filed as: BHASKARANI SRAVAN KUMAR
3 granted patents·19 citations·filing 2007–2012
67Inventor score
Top patents by PatentIndex Score
3 records- 0180US8386864B2Locally synchronous shared BIST architecture for testing embedded memories with asynchronous interfacesST MICROELECTRONICS PVT LTD·Filed 2012·Granted Feb 26, 2013·7 cites·20 claims
- 0278US8108744B2Locally synchronous shared BIST architecture for testing embedded memories with asynchronous interfacesDUBEY PRASHANT·Filed 2007·Granted Jan 31, 2012·11 cites·20 claims
- 0351US8400181B2Integrated circuit die testing apparatus and methodsBHASKARANI SRAVAN KUMAR·Filed 2010·Granted Mar 19, 2013·1 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →